Kirchheim, Reiner

[["dc.bibliographiccitation.firstpage","241"],["dc.bibliographiccitation.issue","1"],["dc.bibliographiccitation.journal","Applied Surface Science"],["dc.bibliographiccitation.lastpage","244"],["dc.bibliographiccitation.volume","255"],["dc.contributor.author","Cizek, Jakub"],["dc.contributor.author","Prochazka, Ivan"],["dc.contributor.author","Vlach, Martin"],["dc.contributor.author","Zaludova, N."],["dc.contributor.author","Danis, Stanislav"],["dc.contributor.author","Dobron, Patrik"],["dc.contributor.author","Chmelik, F."],["dc.contributor.author","Brauer, Gerhard"],["dc.contributor.author","Anwand, W."],["dc.contributor.author","Muecklich, Arndt"],["dc.contributor.author","Nikitin, E."],["dc.contributor.author","Gemma, Ryota"],["dc.contributor.author","Kirchheim, Reiner"],["dc.contributor.author","Pundt, Astrid"],["dc.date.accessioned","2018-11-07T11:09:48Z"],["dc.date.available","2018-11-07T11:09:48Z"],["dc.date.issued","2008"],["dc.description.abstract","Hydrogen loading of thin films introduces very high compressive stresses which grow in magnitude with increasing hydrogen concentration. When the hydrogen-induced stresses exceed a certain critical in-plane stress value, the loaded film starts to detach from the substrate. This results in the formation of buckles of various morphologies in the film layer. Defect studies of a hydrogen loaded Pd film which undergoes a buckling process are presented, using slow positron implantation spectroscopy, in situ acoustic emission, and direct observations of the film structure by transmission electron and optical microscopies. It is found that buckling of the film occurs at hydrogen concentrations x(H) >= 0.1 and causes a significant increase of the dislocation density in the film. (c) 2008 Elsevier B.V. All rights reserved."],["dc.identifier.doi","10.1016/j.apsusc.2008.05.290"],["dc.identifier.isi","000259726900065"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/53087"],["dc.notes.status","zu prüfen"],["dc.notes.submitter","Najko"],["dc.publisher","Elsevier Science Bv"],["dc.publisher.place","Amsterdam"],["dc.relation.conference","11th Workshop on Slow Position Beam Techniques for Solids and Surfaces"],["dc.relation.eventlocation","Musee Sci Naturelles, Orleans, FRANCE"],["dc.relation.issn","0169-4332"],["dc.title","Hydrogen-induced buckling of Pd films studied by positron annihilation"],["dc.type","conference_paper"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.status","published"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","99"],["dc.bibliographiccitation.issue","1"],["dc.bibliographiccitation.journal","Procedia Engineering"],["dc.bibliographiccitation.lastpage","103"],["dc.bibliographiccitation.volume","1"],["dc.contributor.author","Cizek, J."],["dc.contributor.author","Prochazka, I."],["dc.contributor.author","Vlach, M."],["dc.contributor.author","Zaludova, N."],["dc.contributor.author","Dobron, P."],["dc.contributor.author","Chmelik, F."],["dc.contributor.author","Brauer, G."],["dc.contributor.author","Anwand, W."],["dc.contributor.author","Mücklich, A."],["dc.contributor.author","Nikitin, E."],["dc.contributor.author","Gemma, R."],["dc.contributor.author","Pundt, A."],["dc.contributor.author","Kirchheim, R."],["dc.date.accessioned","2019-07-09T11:40:46Z"],["dc.date.available","2019-07-09T11:40:46Z"],["dc.date.issued","2009"],["dc.description.abstract","Hydrogen loading causes a significant volume expansion, which is isotropic in free-standing bulk materials. Contrary to bulk samples, thin films are clamped to an elastically stiff substrate, which prevents in-plane expansion. Hence, volume expansion of a thin film is strongly anisotropic because it expands only in the out-of-plane direction. High internal stresses introduced during hydrogen loading may lead to a situation when detachment of film from the substrate is energetically favorable. In the present work, we studied hydrogen-induced buckling of thin Pd films using a multi-scale approach. Defects in buckled films were characterized on the atomic level by positron annihilation spectroscopy combined with microstructure studies by transmission electron microscopy. Meso-scale measurements were performed by acoustics emission. Observations at the macroscopic level were performed by optical microscopy. It was found that buckling of thin films occurs at hydrogen concentrations xH>0.1. Defect studies of buckled Pd films revealed a significant increase of dislocation density in agreement with acoustic emission studies which demonstrated a correlated movement of dislocations with a well-defined threshold coinciding with the onset of buckling."],["dc.identifier.doi","10.1016/j.proeng.2009.06.024"],["dc.identifier.purl","https://resolver.sub.uni-goettingen.de/purl?gs-1/11293"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/58244"],["dc.language.iso","en"],["dc.notes.intern","Merged from goescholar"],["dc.relation.issn","1877-7058"],["dc.relation.orgunit","Fakultät für Physik"],["dc.rights","CC BY-NC-ND 3.0"],["dc.rights.uri","http://creativecommons.org/licenses/by-nc-nd/3.0/"],["dc.title","Multi-scale analysis of hydrogen-induced buckling in Pd films"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.version","published_version"],["dspace.entity.type","Publication"]]