Wilke, Robin Niklas

[["dc.contributor.author","Osterhoff, Markus"],["dc.contributor.author","Döring, Florian"],["dc.contributor.author","Eberl, Christian"],["dc.contributor.author","Wilke, Robin N."],["dc.contributor.author","Wallentin, Jesper"],["dc.contributor.author","Krebs, Hans-Ulrich"],["dc.contributor.author","Sprung, Michael"],["dc.contributor.author","Salditt, Tim"],["dc.date.accessioned","2017-09-07T11:54:07Z"],["dc.date.available","2017-09-07T11:54:07Z"],["dc.date.issued","2015"],["dc.identifier.doi","10.1117/12.2187799"],["dc.identifier.gro","3145110"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/2810"],["dc.notes.intern","Crossref Import"],["dc.notes.status","public"],["dc.publisher","SPIE"],["dc.publisher.place","Bellingham, Wash."],["dc.relation","SFB 755: Nanoscale Photonic Imaging"],["dc.relation.conference","X-ray nanoimaging: instruments and methods"],["dc.relation.eventend","2015-08-13"],["dc.relation.eventlocation","San Diego, Calif."],["dc.relation.eventstart","2015-08-12"],["dc.relation.isbn","978-1-62841-758-6"],["dc.relation.ispartof","X-ray nanoimaging: instruments and methods II: 12 - 13 August 2015, San Diego, California, United States"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray optics"],["dc.subject.gro","x-ray imaging"],["dc.title","Progress on multi-order hard x-ray imaging with multilayer zone plates"],["dc.type","conference_paper"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","no"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.artnumber","091102"],["dc.bibliographiccitation.issue","9"],["dc.bibliographiccitation.journal","Applied Physics Letters"],["dc.bibliographiccitation.volume","96"],["dc.contributor.author","Schropp, A."],["dc.contributor.author","Boye, P."],["dc.contributor.author","Feldkamp, J. M."],["dc.contributor.author","Hoppe, R."],["dc.contributor.author","Patommel, Jens"],["dc.contributor.author","Samberg, D."],["dc.contributor.author","Stephan, S."],["dc.contributor.author","Giewekemeyer, Klaus"],["dc.contributor.author","Wilke, Robin N."],["dc.contributor.author","Salditt, Tim"],["dc.contributor.author","Gulden, J."],["dc.contributor.author","Mancuso, A. P."],["dc.contributor.author","Vartanyants, I. A."],["dc.contributor.author","Weckert, E."],["dc.contributor.author","Schoeder, S."],["dc.contributor.author","Burghammer, Manfred"],["dc.contributor.author","Schroer, C. G."],["dc.date.accessioned","2017-09-07T11:46:07Z"],["dc.date.available","2017-09-07T11:46:07Z"],["dc.date.issued","2010"],["dc.description.abstract","We have carried out a ptychographic scanning coherent diffraction imaging experiment on a test object in order to characterize the hard x-ray nanobeam in a scanning x-ray microscope. In addition to a high resolution image of the test object, a detailed quantitative picture of the complex wave field in the nanofocus is obtained with high spatial resolution and dynamic range. Both are the result of high statistics due to the large number of diffraction patterns. The method yields a complete description of the focus, is robust against inaccuracies in sample positioning, and requires no particular shape or prior knowledge of the test object."],["dc.identifier.doi","10.1063/1.3332591"],["dc.identifier.gro","3142954"],["dc.identifier.isi","000275246200002"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/415"],["dc.language.iso","en"],["dc.notes.intern","WoS Import 2017-03-10"],["dc.notes.status","final"],["dc.notes.submitter","PUB_WoS_Import"],["dc.relation.issn","0003-6951"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray optics"],["dc.subject.gro","x-ray imaging"],["dc.title","Hard x-ray nanobeam characterization by coherent diffraction microscopy"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","867"],["dc.bibliographiccitation.journal","Journal of Synchrotron Radiation"],["dc.bibliographiccitation.lastpage","878"],["dc.bibliographiccitation.volume","22"],["dc.contributor.author","Salditt, Tim"],["dc.contributor.author","Osterhoff, Markus"],["dc.contributor.author","Krenkel, Martin"],["dc.contributor.author","Wilke, Robin N."],["dc.contributor.author","Priebe, Marius"],["dc.contributor.author","Bartels, Matthias"],["dc.contributor.author","Kalbfleisch, Sebastian"],["dc.contributor.author","Sprung, Michael"],["dc.date.accessioned","2017-09-07T11:43:44Z"],["dc.date.available","2017-09-07T11:43:44Z"],["dc.date.issued","2015"],["dc.description.abstract","A compound optical system for coherent focusing and imaging at the nanoscale is reported, realised by high-gain fixed-curvature elliptical mirrors in combination with X-ray waveguide optics or different cleaning apertures. The key optical concepts are illustrated, as implemented at the Gottingen Instrument for Nano-Imaging with X-rays (GINIX), installed at the P10 coherence beamline of the PETRA III storage ring at DESY, Hamburg, and examples for typical applications in biological imaging are given. Characteristic beam configurations with the recently achieved values are also described, meeting the different requirements of the applications, such as spot size, coherence or bandwidth. The emphasis of this work is on the different beam shaping, filtering and characterization methods."],["dc.identifier.doi","10.1107/S1600577515007742"],["dc.identifier.gro","3141875"],["dc.identifier.isi","000357407900001"],["dc.identifier.pmid","26134789"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/2045"],["dc.language.iso","en"],["dc.notes.intern","WoS Import 2017-03-10"],["dc.notes.status","final"],["dc.notes.submitter","PUB_WoS_Import"],["dc.relation","SFB 755: Nanoscale Photonic Imaging"],["dc.relation.eissn","1600-5775"],["dc.relation.issn","0909-0495"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray optics"],["dc.subject.gro","x-ray imaging"],["dc.subject.gro","x-ray scattering"],["dc.title","Compound focusing mirror and X-ray waveguide optics for coherent imaging and nano-diffraction"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","490"],["dc.bibliographiccitation.issue","3"],["dc.bibliographiccitation.journal","Journal of Synchrotron Radiation"],["dc.bibliographiccitation.lastpage","497"],["dc.bibliographiccitation.volume","20"],["dc.contributor.author","Giewekemeyer, Klaus"],["dc.contributor.author","Wilke, Robin N."],["dc.contributor.author","Osterhoff, Markus"],["dc.contributor.author","Bartels, Matthias"],["dc.contributor.author","Kalbfleisch, Sebastian"],["dc.contributor.author","Salditt, Tim"],["dc.date.accessioned","2020-11-05T15:05:25Z"],["dc.date.available","2020-11-05T15:05:25Z"],["dc.date.issued","2013"],["dc.description.abstract","In the past decade Kirkpatrick-Baez (KB) mirrors have been established as powerful focusing systems in hard X-ray microscopy applications. Here a ptychographic characterization of the KB focus in the dedicated nano-imaging setup GINIX (Gottingen Instrument for Nano-Imaging with X-rays) at the P10 coherence beamline of the PETRA III synchrotron at HASLYLAB/DESY, Germany, is reported. More specifically, it is shown how aberrations in the KB beam, caused by imperfections in the height profile of the focusing mirrors, can be eliminated using a pinhole as a spatial filter near the focal plane. A combination of different pinhole sizes and illumination conditions of the KB setup makes the prepared optical setup well suited not only for high-resolution ptychographic coherent X-ray diffractive imaging but also for moderate-resolution/large-field-of-view propagation imaging in the divergent KB beam."],["dc.identifier.doi","10.1107/S0909049513005372"],["dc.identifier.gro","3142357"],["dc.identifier.isi","000317604800013"],["dc.identifier.pmid","23592629"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/68466"],["dc.language.iso","en"],["dc.notes.intern","DOI Import GROB-352.6"],["dc.notes.status","final"],["dc.notes.submitter","PUB_WoS_Import"],["dc.relation.issn","0909-0495"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray optics"],["dc.subject.gro","x-ray imaging"],["dc.title","Versatility of a hard X-ray Kirkpatrick–Baez focus characterized by ptychography"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]