Raue, Lars

[["dc.bibliographiccitation.firstpage","1379"],["dc.bibliographiccitation.lastpage","1384"],["dc.bibliographiccitation.seriesnr","467/470"],["dc.bibliographiccitation.volume","2"],["dc.contributor.author","Klein, Hannah"],["dc.contributor.author","Preusser, A."],["dc.contributor.author","Bunge, H. J."],["dc.contributor.author","Raue, Lars"],["dc.contributor.editor","Bacroix, B."],["dc.date.accessioned","2018-11-07T10:53:12Z"],["dc.date.available","2018-11-07T10:53:12Z"],["dc.date.issued","2004"],["dc.description.abstract","The newly developed \"sweeping detector\" technique with high energy synchrotron radiation allows to measure textures and microstructures of materials with high location and orientation resolution. This method was applied to hot rolled aluminium manganese alloys and to rolled nickel samples in different recrystallization stages. The grain-resolved measurements show, impressively, many details of the recrystallization process which can otherwise not be seen. That can be the base for comprehensive recrystallization theories."],["dc.identifier.isi","000225119800214"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/49300"],["dc.language.iso","en"],["dc.notes.status","final"],["dc.notes.submitter","Najko"],["dc.publisher","Trans Tech Publications Ltd."],["dc.publisher.place","Züich-Uetikon"],["dc.relation.conference","2nd Joint International Conference on Recrystallization and Grain Growth"],["dc.relation.crisseries","Materials Science Forum"],["dc.relation.eventend","2004-09-03"],["dc.relation.eventlocation","Annecy, FRANCE"],["dc.relation.eventstart","2004-08-30"],["dc.relation.isbn","0-87849-952-0"],["dc.relation.ispartof","Recrystallization and grain growth"],["dc.relation.ispartofseries","Materials science forum; 467/470"],["dc.relation.issn","0255-5476"],["dc.title","Recrystallization texture and microstructure in Ni and AlMg1Mn1 determined with high-energy synchrotron radiation"],["dc.type","conference_paper"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","137"],["dc.bibliographiccitation.lastpage","142"],["dc.bibliographiccitation.seriesnr","495/497,1"],["dc.contributor.author","Klein, Hannah"],["dc.contributor.author","Preusser, A."],["dc.contributor.author","Raue, Lars"],["dc.contributor.author","Bunge, H. J."],["dc.date.accessioned","2018-11-07T08:40:19Z"],["dc.date.available","2018-11-07T08:40:19Z"],["dc.date.issued","2005"],["dc.description.abstract","The new developed \"sweeping detector\" techniques using high energy synchrotron radiation allow to measure textures and microstructures of materials and their change during heat treatment with high location and orientation resolution. Here we show these new methods applied to cold rolled and subsequently annealed nickel samples. The grain-resolved measurements show, impressively, many details of the recrystallization process which can otherwise not be seen. The results of these measurements can be the base for comprehensive recrystallization theories."],["dc.identifier.isi","000231284400018"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/19202"],["dc.notes.status","zu prüfen"],["dc.notes.submitter","Najko"],["dc.publisher","Trans Tech Publications"],["dc.publisher.place","Zürich"],["dc.relation.conference","14th International Conference on Textures of Materials"],["dc.relation.crisseries","Materials Science Forum"],["dc.relation.eventend","2005-07-15"],["dc.relation.eventlocation","Leuven, Belgium"],["dc.relation.eventstart","2005-07-11"],["dc.relation.ispartof","Textures of materials: ICOTOM 14; proceedings of the 14th International Conference on Textures of Materials"],["dc.relation.ispartofseries","Materials science forum; 495/497,1"],["dc.title","Measurement of high-resolution recrystallization textures in nickel sheets using high-energy synchrotron radiation"],["dc.type","conference_paper"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","143"],["dc.bibliographiccitation.lastpage","148"],["dc.bibliographiccitation.seriesnr","495/497,1"],["dc.contributor.author","Preusser, A."],["dc.contributor.author","Klein, Hannah"],["dc.contributor.author","Raue, Lars"],["dc.contributor.author","Bunge, H. J."],["dc.date.accessioned","2018-11-07T08:40:21Z"],["dc.date.available","2018-11-07T08:40:21Z"],["dc.date.issued","2005"],["dc.description.abstract","The 'Moving Area Detector Method' with high energy synchrotron radiation allows to measure textures and microstructures of materials with high location and orientation resolution, e.g. so called Multipeak Textures. In this paper the measuring method is described shortly, as well as a description and the calculation of Multipeak Textures are given. A few examples of synthetic calculated Multipeak pole figures are shown."],["dc.identifier.isi","000231284400019"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/19213"],["dc.notes.status","zu prüfen"],["dc.notes.submitter","Najko"],["dc.publisher","Trans Tech Publications"],["dc.publisher.place","Zürich"],["dc.relation.crisseries","Materials Science Forum"],["dc.relation.eventend","2005-07-15"],["dc.relation.eventlocation","Leuven, Belgium"],["dc.relation.eventstart","2005-07-11"],["dc.relation.ispartof","Textures of materials: ICOTOM 14; proceedings of the 14th International Conference on Textures of Materials"],["dc.relation.ispartofseries","Materials science forum; 495/497,1"],["dc.title","Determination of multipeak textures with high-energy synchrotron radiation"],["dc.type","conference_paper"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dspace.entity.type","Publication"]]