Metzger, Till Hartmut

[["dc.bibliographiccitation.seriesnr","1355"],["dc.contributor.author","Salditt, Tim"],["dc.contributor.author","Metzger, T. H."],["dc.contributor.author","Peisl, J."],["dc.contributor.author","Morawe, C. H."],["dc.contributor.author","Zabel, H."],["dc.date.accessioned","2017-09-07T11:54:11Z"],["dc.date.available","2017-09-07T11:54:11Z"],["dc.date.issued","2011"],["dc.identifier.doi","10.1557/proc-355-269"],["dc.identifier.gro","3145131"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/2833"],["dc.notes.intern","Crossref Import"],["dc.notes.status","public"],["dc.publisher","Cambridge University Press (CUP)"],["dc.publisher.place","New York"],["dc.relation.conference","Symposium JJ, Biological Hybrid Materials for Life Sciences"],["dc.relation.crisseries","Materials Research Society Symposium Proceedings"],["dc.relation.eventend","2011-04-29"],["dc.relation.eventlocation","San Francisco, Calif."],["dc.relation.eventstart","2011-04-25"],["dc.relation.isbn","978-1-62748-200-4"],["dc.relation.ispartof","Biological hybrid materials for life sciences"],["dc.relation.ispartofseries","Materials Research Society symposium proceedings; 1355"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray scattering"],["dc.title","Interface Morphology of RF-Sputtered NB/AL2O3 Multilayers Studied by X-Ray Reflectivity and Diffuse Scattering"],["dc.type","conference_paper"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","no"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","C470"],["dc.bibliographiccitation.issue","a1"],["dc.bibliographiccitation.journal","Acta Crystallographica. Section A, Foundations and Advances"],["dc.bibliographiccitation.lastpage","C470"],["dc.bibliographiccitation.volume","52"],["dc.contributor.author","Metzger, Till Hartmut"],["dc.contributor.author","Salditt, Tim"],["dc.contributor.author","Lott, D"],["dc.contributor.author","Peisl, J."],["dc.date.accessioned","2020-03-11T10:40:01Z"],["dc.date.available","2020-03-11T10:40:01Z"],["dc.date.issued","1996"],["dc.identifier.doi","10.1107/S0108767396080737"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/63302"],["dc.language.iso","en"],["dc.relation.issn","0108-7673"],["dc.title","Diffuse X-ray scattering from rough interfaces in sputtered W/Si multilayers"],["dc.type","journal_article"],["dc.type.internalPublication","unknown"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","1890"],["dc.bibliographiccitation.issue","10"],["dc.bibliographiccitation.journal","Physical Review Letters"],["dc.bibliographiccitation.lastpage","1890"],["dc.bibliographiccitation.volume","74"],["dc.contributor.author","Salditt, T."],["dc.contributor.author","Metzger, T. H."],["dc.contributor.author","Peisl, J."],["dc.date.accessioned","2022-06-08T08:00:06Z"],["dc.date.available","2022-06-08T08:00:06Z"],["dc.date.issued","1995"],["dc.identifier.doi","10.1103/PhysRevLett.74.1890.2"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/110961"],["dc.language.iso","en"],["dc.notes.intern","DOI-Import GROB-575"],["dc.relation.eissn","1079-7114"],["dc.relation.issn","0031-9007"],["dc.title","Kinetic Roughness of Amorphous Multilayers Studied by Diffuse X-Ray Scattering"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","5179"],["dc.bibliographiccitation.issue","10"],["dc.bibliographiccitation.journal","Journal of Applied Physics"],["dc.bibliographiccitation.lastpage","5184"],["dc.bibliographiccitation.volume","83"],["dc.contributor.author","Salditt, T."],["dc.contributor.author","Metzger, T. H."],["dc.contributor.author","Peisl, J."],["dc.contributor.author","Feidenhans'L, R."],["dc.date.accessioned","2017-09-07T11:48:10Z"],["dc.date.available","2017-09-07T11:48:10Z"],["dc.date.issued","1998"],["dc.description.abstract","We have measured the structure factor of diffuse scattering and amorphous scattering in a W/Si multilayer under simultaneous excitation of x-ray standing waves. The tuning of the nodes and antinodes to the location of the W and Si sublayers or to the respective interfaces increases the selective sensitivity to the structure of the respective sublayer or interface. The dynamically broadened first multilayer Bragg peak is modeled by the Darwin theory of dynamic diffraction, which allows for the exact determination of the standing wave phase. The decay of diffuse intensity, as measured in a grazing incidence geometry at different standing wave phase shifts, indicates that the height-height self-correlation function is of the same form for both types of interfaces, W/Si and Si/W. The amorphous peaks of the Si sublayer can only be observed if the angles of incidence and exit are optimized to suppress the scattering from the otherwise dominating W layers. The peak positions are the same as for bulk amorphous silicon. (C) 1998 American Institute of Physics."],["dc.identifier.doi","10.1063/1.367337"],["dc.identifier.gro","3144549"],["dc.identifier.isi","000073773600024"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/2185"],["dc.language.iso","en"],["dc.notes.intern","WoS Import 2017-03-10"],["dc.notes.status","final"],["dc.notes.submitter","PUB_WoS_Import"],["dc.relation.issn","0021-8979"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray scattering"],["dc.title","Elastic scattering under simultaneous excitation of x-ray standing waves in multilayers"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","C464"],["dc.bibliographiccitation.issue","a1"],["dc.bibliographiccitation.journal","Acta Crystallographica. Section A, Foundations and Advances"],["dc.bibliographiccitation.lastpage","C464"],["dc.bibliographiccitation.volume","52"],["dc.contributor.author","Salditt, Tim"],["dc.contributor.author","Metzger, Till Hartmut"],["dc.contributor.author","Lott, D"],["dc.contributor.author","Peisl, J."],["dc.date.accessioned","2020-03-11T10:38:56Z"],["dc.date.available","2020-03-11T10:38:56Z"],["dc.date.issued","1996"],["dc.identifier.doi","10.1107/S0108767396080981"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/63301"],["dc.language.iso","en"],["dc.relation.issn","0108-7673"],["dc.title","Interface roughness in sputtered W/Si multilayers and related growth models"],["dc.type","journal_article"],["dc.type.internalPublication","unknown"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","1573"],["dc.bibliographiccitation.issue","9"],["dc.bibliographiccitation.journal","Journal de Physique. III"],["dc.bibliographiccitation.lastpage","1580"],["dc.bibliographiccitation.volume","4"],["dc.contributor.author","Salditt, Tim"],["dc.contributor.author","Metzger, Till Hartmut"],["dc.contributor.author","Peisl, J."],["dc.contributor.author","Jiang, Xiangning"],["dc.date.accessioned","2017-09-07T11:51:25Z"],["dc.date.available","2017-09-07T11:51:25Z"],["dc.date.issued","1994"],["dc.description.abstract","We present a new method to measure the diffuse scattering of amorphous multilayers. In contrast to conventional scans, that all take place in the plane of reflection, in this out-of-plane scattering geometry the accessible range in parallel momentum transfer Q(parallel-to) is not limited by the sample surface. We can therefore record data continuously from very small Q(parallel-to) up to Q(parallel-to) congruent-to 2pi/lambda, holding Q(perpendicular-to) constant at the same time. We thereby obtain a scattering factor S(Q) of our sample, that can easily be attributed to diffuse scattering at rough interfaces or amorphous bulk, respectively. In the case of the W/C amorphous multilayer studied here, the data show that the contribution of amorphous scattering is less than 2% up to about Q(parallel-to) = 0.1 angstrom-1, and becomes dominant only in the wide angle region. This allows to draw the conclusion, that the Bragg sheets observed in the vicinity of the specular condition are mainly due to conformal roughness of the multilayer interfaces."],["dc.identifier.doi","10.1051/jp3:1994224"],["dc.identifier.gro","3144722"],["dc.identifier.isi","A1994PH37300009"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/2377"],["dc.notes.intern","WoS Import 2017-03-10"],["dc.notes.status","zu prüfen"],["dc.notes.submitter","PUB_WoS_Import"],["dc.relation.issn","1155-4320"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray scattering"],["dc.title","Diffuse X-ray scattering of amorphous multilayers"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","171"],["dc.bibliographiccitation.issue","C9"],["dc.bibliographiccitation.journal","Journal de Physique. IV, Proceedings"],["dc.bibliographiccitation.lastpage","174"],["dc.bibliographiccitation.volume","4"],["dc.contributor.author","Salditt, Tim"],["dc.contributor.author","Metzger, Till Hartmut"],["dc.contributor.author","Peisl, J."],["dc.date.accessioned","2020-03-11T11:01:58Z"],["dc.date.available","2020-03-11T11:01:58Z"],["dc.date.issued","1994"],["dc.description.abstract","We present diffuse, nonspecular x-ray measurements of the interface height-height self-correlations in an amorphous WlSi multilayer. The measurements have been performed in a scattering geometry that is placed out of the plane of reflection, giving access to a much lar- ger range in parallel momentum transfer than in conventional nonspecular geometries. For the sample studied a logarithmic form of the correlation function is found."],["dc.identifier.doi","10.1051/jp4:1994928"],["dc.identifier.gro","3144712"],["dc.identifier.isi","A1994PZ05800029"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/63304"],["dc.language.iso","en"],["dc.notes.intern","WoS Import 2017-03-10"],["dc.notes.status","zu prüfen"],["dc.notes.submitter","PUB_WoS_Import"],["dc.relation.eventlocation","AIX-EN-PROVENCE, FRANCE"],["dc.relation.issn","1155-4339"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray scattering"],["dc.title","Characterization of roughness correlations in W/Si multilayers by diffuse x-ray scattering"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","227"],["dc.bibliographiccitation.issue","2"],["dc.bibliographiccitation.journal","Zeitschrift für Physik. B, Condensed Matter"],["dc.bibliographiccitation.lastpage","230"],["dc.bibliographiccitation.volume","96"],["dc.contributor.author","Salditt, Tim"],["dc.contributor.author","Rhee, Hong Jun"],["dc.contributor.author","Metzger, Till Hartmut"],["dc.contributor.author","Peisl, J."],["dc.contributor.author","Schuster, Richard"],["dc.contributor.author","Kotthaus, Jörg P."],["dc.date.accessioned","2017-09-07T11:51:23Z"],["dc.date.available","2017-09-07T11:51:23Z"],["dc.date.issued","1994"],["dc.description.abstract","We measure the nonspecular x-ray scattering at grazing incidence and exit angles from a GaAs surface, modulated by an one-dimensional lateral grating of effectively variable periodicity 1 mu m less than or equal to d less than or equal to 60 mu m. Due to the projection onto the sample surface, the lateral coherence length is enlarged by a factor of more than 100. The line broadening of the diffraction maxima is used to deduce the number of periods that add up coherently for a given period d and given angle of incidence. We demonstrate that the scattering geometry used allows for large coherently illuminated lengths on the sample and ultra small angle resolution of one- or two-dimensional objects. Thus structures of mu m size and larger will be accessible by coherent x-ray scattering."],["dc.identifier.doi","10.1007/BF01313288"],["dc.identifier.gro","3144711"],["dc.identifier.isi","A1994PV45600011"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/2365"],["dc.language.iso","en"],["dc.notes.intern","WoS Import 2017-03-10"],["dc.notes.status","zu prüfen"],["dc.notes.submitter","PUB_WoS_Import"],["dc.relation.issn","0722-3277"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray scattering"],["dc.title","X-ray coherence and ultra small angle resolution at grazing incidence and exit angles"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","5617"],["dc.bibliographiccitation.issue","9"],["dc.bibliographiccitation.journal","Physical Review. B"],["dc.bibliographiccitation.lastpage","5627"],["dc.bibliographiccitation.volume","51"],["dc.contributor.author","Salditt, Tim"],["dc.contributor.author","Metzger, Till Hartmut"],["dc.contributor.author","Brandt, Ch."],["dc.contributor.author","KLEMRADT, U."],["dc.contributor.author","Peisl, J."],["dc.date.accessioned","2017-09-07T11:51:21Z"],["dc.date.available","2017-09-07T11:51:21Z"],["dc.date.issued","1995"],["dc.identifier.doi","10.1103/PhysRevB.51.5617"],["dc.identifier.gro","3144698"],["dc.identifier.isi","A1995QL71700002"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/2351"],["dc.language.iso","en"],["dc.notes.intern","WoS Import 2017-03-10"],["dc.notes.status","zu prüfen"],["dc.notes.submitter","PUB_WoS_Import"],["dc.relation.issn","0163-1829"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray scattering"],["dc.subject.gro","membrane biophysics"],["dc.title","Determination of the static scaling exponent of self-affine interfaces by nonspecular x-ray scattering"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","A236"],["dc.bibliographiccitation.issue","4A"],["dc.bibliographiccitation.journal","Journal of Physics D: Applied Physics"],["dc.bibliographiccitation.lastpage","A240"],["dc.bibliographiccitation.volume","28"],["dc.contributor.author","Salditt, Tim"],["dc.contributor.author","Metzger, Till Hartmut"],["dc.contributor.author","Peisl, J."],["dc.contributor.author","Goerigk, G."],["dc.date.accessioned","2017-09-07T11:51:12Z"],["dc.date.available","2017-09-07T11:51:12Z"],["dc.date.issued","1995"],["dc.description.abstract","We present measurements of non-specular x-ray scattering from rough interfaces at a dedicated small-angle scattering beamline that allows for very low divergence of the incident beam and therefore for high resolution close to the specularly reflected beam. A two-dimensional detector is used to measure the non-specular intensity both in and out of the plane of reflection. The method is exemplified by an Au single layer, an amorphous Nb/Al2O3 multilayer and an epitaxial GaAs/AlAs superlattice sample."],["dc.identifier.doi","10.1088/0022-3727/28/4A/046"],["dc.identifier.gro","3144691"],["dc.identifier.isi","A1995QX64000048"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/2342"],["dc.language.iso","en"],["dc.notes.intern","WoS Import 2017-03-10"],["dc.notes.status","zu prüfen"],["dc.notes.submitter","PUB_WoS_Import"],["dc.relation.issn","0022-3727"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray scattering"],["dc.subject.gro","membrane biophysics"],["dc.title","Non-specular X-ray scattering from thin films and multilayers with small-angle scattering equipment"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]