Soltau, Jakob

[["dc.bibliographiccitation.firstpage","1573"],["dc.bibliographiccitation.issue","5"],["dc.bibliographiccitation.journal","Journal of Synchrotron Radiation"],["dc.bibliographiccitation.lastpage","1582"],["dc.bibliographiccitation.volume","28"],["dc.contributor.author","Soltau, Jakob"],["dc.contributor.author","Chayanun, Lert"],["dc.contributor.author","Lyubomirskiy, Mikhail"],["dc.contributor.author","Wallentin, Jesper"],["dc.contributor.author","Osterhoff, Markus"],["dc.date.accessioned","2021-10-01T09:57:56Z"],["dc.date.available","2021-10-01T09:57:56Z"],["dc.date.issued","2021"],["dc.description.abstract","Using multilayer zone plates (MZPs) as two-dimensional optics, focal spot sizes of less than 10 nm can be achieved, as we show here with a focus of 8.4 nm × 9.6 nm, but the need for order-sorting apertures prohibits practical working distances. To overcome this issue, here an off-axis illumination of a circular MZP is introduced to trade off between working distance and focal spot size. By this, the working distance between order-sorting aperture and sample can be more than doubled. Exploiting a 2D focus of 16 nm × 28 nm, real-space 2D mapping of local electric fields and charge carrier recombination using X-ray beam induced current in a single InP nanowire is demonstrated. Simulations show that a dedicated off-axis MZP can reach sub-10 nm focusing combined with reasonable working distances and low background, which could be used for in operando imaging of composition, carrier collection and strain in nanostructured devices."],["dc.description.abstract","Using multilayer zone plates (MZPs) as two-dimensional optics, focal spot sizes of less than 10 nm can be achieved, as we show here with a focus of 8.4 nm × 9.6 nm, but the need for order-sorting apertures prohibits practical working distances. To overcome this issue, here an off-axis illumination of a circular MZP is introduced to trade off between working distance and focal spot size. By this, the working distance between order-sorting aperture and sample can be more than doubled. Exploiting a 2D focus of 16 nm × 28 nm, real-space 2D mapping of local electric fields and charge carrier recombination using X-ray beam induced current in a single InP nanowire is demonstrated. Simulations show that a dedicated off-axis MZP can reach sub-10 nm focusing combined with reasonable working distances and low background, which could be used for in operando imaging of composition, carrier collection and strain in nanostructured devices."],["dc.identifier.doi","10.1107/S1600577521006159"],["dc.identifier.pii","S1600577521006159"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/89948"],["dc.notes.intern","DOI Import GROB-469"],["dc.relation.issn","1600-5775"],["dc.title","Off-axis multilayer zone plate with 16 nm × 28 nm focus for high-resolution X-ray beam induced current imaging"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dspace.entity.type","Publication"]]