Soltau, Jakob

[["dc.bibliographiccitation.firstpage","41932"],["dc.bibliographiccitation.issue","25"],["dc.bibliographiccitation.journal","Optics Express"],["dc.bibliographiccitation.volume","29"],["dc.contributor.author","Soltau, Jakob"],["dc.contributor.author","Lohse, Leon Merten"],["dc.contributor.author","Osterhoff, Markus"],["dc.contributor.author","Salditt, Tim"],["dc.date.accessioned","2021-12-02T15:07:31Z"],["dc.date.available","2021-12-02T15:07:31Z"],["dc.date.issued","2021-12-01"],["dc.description.abstract","Recent progress in nanofabrication, namely of multilayer optics, and the constructionof coherent hard x-ray sources has enabled high resolution x-ray microscopy with large numericalaperture optics for small focal spot sizes. Sub-10 nm and even sub-5 nm focal spot sizes havealready been achieved using multilayer optics such as multilayer Laue lenses and multilayerzone plates. However these optics can not be described by the kinematic theory given theirextreme aspect-ratio between the depth (thickness) and the layer width. Moreover, the numericalsimulation of these optics is challenging, and the absence of an accessible numerical frameworkinhibits further progress in their design and utilization. Here, we simulate the propagation of x-raywavefields within and behind optical multilayer elements using a finite-difference propagationmethod. We show that the method offers high accuracy at reasonable computational cost. Weinvestigate how small focal spot sizes and highest diffraction efficiency of multilayer opticscan be achieved, considering volume diffraction effects such as waveguiding and Pendellösung.Finally, we show the simulation of a novel imaging scheme, allowing for a detailed study ofimage formation and the development of customized phase retrieval schemes."],["dc.identifier.doi","10.1364/OE.445300"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/94973"],["dc.relation.issn","1094-4087"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.title","Finite-difference propagation for the imulation of x-ray multilayer optics"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","29"],["dc.contributor.author","Krebs, Hans Ulrich"],["dc.contributor.author","Soltau, Jakob"],["dc.contributor.author","Eberl, Christian"],["dc.contributor.author","Osterhoff, Markus"],["dc.contributor.editor","Somogyi, Andrea"],["dc.contributor.editor","Lai, Barry"],["dc.date.accessioned","2020-02-24T13:18:03Z"],["dc.date.available","2020-02-24T13:18:03Z"],["dc.date.issued","2017"],["dc.identifier.doi","10.1117/12.2271141"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/63005"],["dc.notes.preprint","yes"],["dc.relation","SFB 755: Nanoscale Photonic Imaging"],["dc.relation.conference","SPIE"],["dc.relation.eventlocation","San Diego"],["dc.relation.eventstart","2017"],["dc.relation.isbn","978-1-5106-1235-8"],["dc.relation.isbn","978-1-5106-1236-5"],["dc.relation.iserratumof","yes"],["dc.title","Faster scanning and higher resolution: new setup for multilayer zone plate imaging"],["dc.type","conference_paper"],["dc.type.internalPublication","yes"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","1573"],["dc.bibliographiccitation.issue","5"],["dc.bibliographiccitation.journal","Journal of Synchrotron Radiation"],["dc.bibliographiccitation.lastpage","1582"],["dc.bibliographiccitation.volume","28"],["dc.contributor.author","Soltau, Jakob"],["dc.contributor.author","Chayanun, Lert"],["dc.contributor.author","Lyubomirskiy, Mikhail"],["dc.contributor.author","Wallentin, Jesper"],["dc.contributor.author","Osterhoff, Markus"],["dc.date.accessioned","2021-10-01T09:57:56Z"],["dc.date.available","2021-10-01T09:57:56Z"],["dc.date.issued","2021"],["dc.description.abstract","Using multilayer zone plates (MZPs) as two-dimensional optics, focal spot sizes of less than 10 nm can be achieved, as we show here with a focus of 8.4 nm × 9.6 nm, but the need for order-sorting apertures prohibits practical working distances. To overcome this issue, here an off-axis illumination of a circular MZP is introduced to trade off between working distance and focal spot size. By this, the working distance between order-sorting aperture and sample can be more than doubled. Exploiting a 2D focus of 16 nm × 28 nm, real-space 2D mapping of local electric fields and charge carrier recombination using X-ray beam induced current in a single InP nanowire is demonstrated. Simulations show that a dedicated off-axis MZP can reach sub-10 nm focusing combined with reasonable working distances and low background, which could be used for in operando imaging of composition, carrier collection and strain in nanostructured devices."],["dc.description.abstract","Using multilayer zone plates (MZPs) as two-dimensional optics, focal spot sizes of less than 10 nm can be achieved, as we show here with a focus of 8.4 nm × 9.6 nm, but the need for order-sorting apertures prohibits practical working distances. To overcome this issue, here an off-axis illumination of a circular MZP is introduced to trade off between working distance and focal spot size. By this, the working distance between order-sorting aperture and sample can be more than doubled. Exploiting a 2D focus of 16 nm × 28 nm, real-space 2D mapping of local electric fields and charge carrier recombination using X-ray beam induced current in a single InP nanowire is demonstrated. Simulations show that a dedicated off-axis MZP can reach sub-10 nm focusing combined with reasonable working distances and low background, which could be used for in operando imaging of composition, carrier collection and strain in nanostructured devices."],["dc.identifier.doi","10.1107/S1600577521006159"],["dc.identifier.pii","S1600577521006159"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/89948"],["dc.notes.intern","DOI Import GROB-469"],["dc.relation.issn","1600-5775"],["dc.title","Off-axis multilayer zone plate with 16 nm × 28 nm focus for high-resolution X-ray beam induced current imaging"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.artnumber","1038608"],["dc.bibliographiccitation.firstpage","7"],["dc.contributor.author","Krebs, Hans-Ulrich"],["dc.contributor.author","Soltau, Jakob"],["dc.contributor.author","Eberl, Christian"],["dc.contributor.author","Osterhoff, Markus"],["dc.contributor.editor","Goto, Shunji"],["dc.contributor.editor","Khounsary, Ali M."],["dc.contributor.editor","Morawe, Christian"],["dc.date.accessioned","2020-01-31T12:33:22Z"],["dc.date.available","2020-01-31T12:33:22Z"],["dc.date.issued","2017"],["dc.description.abstract","Penetration lengths in the millimetre range make hard x-rays above 60 keV a well-suited tool for non-invasive probing of small specimens buried deep inside their surroundings, and enable studying individual components inside assembled, complex devices (solar cells, batteries etc.). The real-space resolution of typical imaging modalities like fluorescence mapping, scanning SAXS and WAXS depend on the available beam size. Although routine in the 5–25keV regime [1-4], spot sizes below 50nm are very challenging at x-ray energies above 50 keV: Compound refractive lenses lack in refractive power, the multilayer thickness of coated mirrors is bounded by interfacial diffusion, and lithographic Fresnel Zone Plates loose their efficiency in the two-digit keV regime. Multilayer Laue Lenses and Multilayer Zone Plates (MZP) are promising candidates for high-keV focusing to small spot sizes; compared to Fresnel Zone Plates, the aspect ratio comparing outermost layer width (~focal spot size) to optical thickness (efficiency) is virtually unlimited by the fabrication. Using Pulsed Laser Deposition on a rotating wire (several millimetre long), we have fabricated an MZP with 10nm outermost zone widths and optical thickness of 30 μm(optimum phase shift at 60 keV), yielding an unprecedented ultra-high aspect ratio of 1:3000 (outermost zone width compared to optical thickness). We present experimental results obtained at ESRF’s high energy beamline ID31, where for the first time scanning experiments with real-space resolutions below 50nm even at x-ray energies ranging from 60 keV to above 100 keV have been achieved."],["dc.identifier.doi","10.1117/12.2271139"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/62921"],["dc.language.iso","en"],["dc.relation","SFB 755: Nanoscale Photonic Imaging"],["dc.relation.conference","SPIE Optical Engineering + Applications, 2017,"],["dc.relation.eventend","2017"],["dc.relation.eventlocation","San Diego, California, United States"],["dc.relation.eventstart","2017"],["dc.relation.isbn","978-1-5106-1229-7"],["dc.relation.isbn","978-1-5106-1230-3"],["dc.relation.ispartof","Proc. SPIE 10386, Advances in X-Ray/EUV Optics and Components XII"],["dc.subject.gro","x-ray optics and imaging"],["dc.title","Ultra-high-aspect multilayer zone plates for even higher x-ray energies"],["dc.type","conference_paper"],["dc.type.internalPublication","yes"],["dspace.entity.type","Publication"]]