Burlaka, Vladimir

[["dc.bibliographiccitation.firstpage","S388"],["dc.bibliographiccitation.journal","Journal of Alloys and Compounds"],["dc.bibliographiccitation.lastpage","S391"],["dc.bibliographiccitation.volume","645"],["dc.contributor.author","Burlaka, Vladimir"],["dc.contributor.author","Wagner, Stefan"],["dc.contributor.author","Pundt, Astrid"],["dc.date.accessioned","2018-11-07T09:50:22Z"],["dc.date.available","2018-11-07T09:50:22Z"],["dc.date.issued","2015"],["dc.description.abstract","Hydride precipitation in 25 nm and 40 nm epitaxial Nb-films was studied by Scanning Tunnelling Microscopy (STM) supported by X-ray diffraction (XRD) measurements. In combination, these methods yield information about the phase transition, the coherency state, the hydride precipitates' density and size as well as their lateral distribution, at 293 K. For both film thicknesses, hydride formation was detected with STM; it can be easily missed by XRD. While the 25 nm film showed a coherent phase transition, the phase transition was incoherent for the 40 nm film. This is in good accordance with theory. The phase transition features are found to strongly depend on the coherency state: a large number of small hydrides appear in the coherent regime while a small number of large hydrides evolve in the incoherent regime. (C) 2014 Elsevier B.V. All rights reserved."],["dc.identifier.doi","10.1016/j.jallcom.2014.12.103"],["dc.identifier.isi","000360404100088"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/35693"],["dc.notes.status","zu prüfen"],["dc.notes.submitter","Najko"],["dc.publisher","Elsevier Science Sa"],["dc.publisher.place","Lausanne"],["dc.relation.conference","14th International Symposium on Metal-Hydrogen Systems (MH)"],["dc.relation.eventend","2014-07-25"],["dc.relation.eventlocation","Salford, ENGLAND"],["dc.relation.eventstart","2014-07-20"],["dc.relation.issn","1873-4669"],["dc.relation.issn","0925-8388"],["dc.relation.orgunit","Institut für Materialphysik"],["dc.title","In-situ STM and XRD studies on Nb-H films: Coherent and incoherent phase transitions"],["dc.type","conference_paper"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","64"],["dc.bibliographiccitation.journal","Thin Solid Films"],["dc.bibliographiccitation.lastpage","71"],["dc.bibliographiccitation.volume","679"],["dc.contributor.author","Burlaka, Vladimir"],["dc.contributor.author","Wagner, Stefan"],["dc.contributor.author","Hamm, Magnus"],["dc.contributor.author","Pundt, Astrid"],["dc.date.accessioned","2020-12-10T15:21:39Z"],["dc.date.available","2020-12-10T15:21:39Z"],["dc.date.issued","2019"],["dc.identifier.doi","10.1016/j.tsf.2019.04.002"],["dc.identifier.issn","0040-6090"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/73103"],["dc.language.iso","en"],["dc.notes.intern","DOI Import GROB-354"],["dc.relation.orgunit","Institut für Materialphysik"],["dc.title","Tayloring surface morphologies and stress states of thin niobium epitaxial films on sapphire substrates"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","978"],["dc.bibliographiccitation.issue","10"],["dc.bibliographiccitation.journal","Scripta Materialia"],["dc.bibliographiccitation.lastpage","981"],["dc.bibliographiccitation.volume","64"],["dc.contributor.author","Wagner, Stefan"],["dc.contributor.author","Uchida, Helmut"],["dc.contributor.author","Burlaka, Vladimir"],["dc.contributor.author","Vlach, Martin"],["dc.contributor.author","Vlcek, Marian"],["dc.contributor.author","Lukac, Frantisek"],["dc.contributor.author","Cizek, Jakub"],["dc.contributor.author","Baehtz, Carsten"],["dc.contributor.author","Bell, Anthony"],["dc.contributor.author","Pundt, Astrid"],["dc.date.accessioned","2018-11-07T08:56:47Z"],["dc.date.available","2018-11-07T08:56:47Z"],["dc.date.issued","2011"],["dc.description.abstract","The thermodynamics of structural phase transformations in thin films depends on the mechanical stress that can be released by plastic deformation. For thin films below a critical film thickness, plastic deformation is energetically unfavourable: thus, the system stays coherent and stress remains. For PdHc films less than 22 nm thick, a new situation emerges: while the interfaces between matrix and hydride precipitates remain coherent throughout the complete phase transition, misfit dislocations form between the hydride phase and the substrate. (C) 2011 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved."],["dc.identifier.doi","10.1016/j.scriptamat.2011.02.004"],["dc.identifier.isi","000289330700014"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/23236"],["dc.notes.status","zu prüfen"],["dc.notes.submitter","Najko"],["dc.publisher","Pergamon-elsevier Science Ltd"],["dc.relation.issn","1359-6462"],["dc.title","Achieving coherent phase transition in palladium-hydrogen thin films"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.status","published"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","1890"],["dc.bibliographiccitation.issue","14"],["dc.bibliographiccitation.journal","ChemPhysChem"],["dc.bibliographiccitation.lastpage","1904"],["dc.bibliographiccitation.volume","20"],["dc.contributor.author","Wagner, Stefan"],["dc.contributor.author","Klose, Philipp"],["dc.contributor.author","Burlaka, Vladimir"],["dc.contributor.author","Nörthemann, Kai"],["dc.contributor.author","Hamm, Magnus"],["dc.contributor.author","Pundt, Astrid"],["dc.date.accessioned","2020-12-10T14:05:59Z"],["dc.date.available","2020-12-10T14:05:59Z"],["dc.date.issued","2019"],["dc.identifier.doi","10.1002/cphc.201900247"],["dc.identifier.eissn","1439-7641"],["dc.identifier.issn","1439-4235"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/69734"],["dc.language.iso","en"],["dc.notes.intern","DOI Import GROB-354"],["dc.relation.orgunit","Institut für Materialphysik"],["dc.title","Structural Phase Transitions in Niobium Hydrogen Thin Films: Mechanical Stress, Phase Equilibria and Critical Temperatures"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","6207"],["dc.bibliographiccitation.issue","10"],["dc.bibliographiccitation.journal","Nano Letters"],["dc.bibliographiccitation.lastpage","6212"],["dc.bibliographiccitation.volume","16"],["dc.contributor.author","Burlaka, Vladimir"],["dc.contributor.author","Wagner, Stefan"],["dc.contributor.author","Hamm, Magnus"],["dc.contributor.author","Pundt, Astrid"],["dc.date.accessioned","2018-11-07T10:07:52Z"],["dc.date.available","2018-11-07T10:07:52Z"],["dc.date.issued","2016"],["dc.description.abstract","Hydrogen uptake in metal hydrogen (M-H) nanosized systems (e.g., thin films, clusters) is both a fundamental and a technologically relevant topic, which is becoming more important due to the recent developments of hydrogen sensors, purification membranes, and hydrogen storage solutions. It was recently shown that hydrogen (H) absorption in nanosized systems adhered to rigid substrates can lead to ultrahigh mechanical stress in the GPa range. About -10 GPa (compressive) stress were reported for hydrogen loaded niobium (Nb) thin films. Such high stresses can be achieved when conventional stress-release channels are closed, e.g., by reducing the system size. In this paper, we demonstrate that the high stress can be used to strongly modify the system's thermodynamics. In particular, a complete suppression of the phase transformation is achieved by reducing the film thickness below a switchover value d(so). Combined in situ scanning tunneling microscopy (STM) and in situ X-ray diffraction (XRD) measurements serve to determine the switchover thickness of epitaxial Nb/Al2O3 films in the thickness range from 55 to 5 rim. A switchover thickness d(so) = 9 +/- 1 nm is found at T = 294 K. This result is supported by complementary methods such as electromotive force (EMF), electrical resistance, and mechanical stress measurements in combination with theoretical modeling."],["dc.identifier.doi","10.1021/acs.nanolett.6b02467"],["dc.identifier.isi","000385469800032"],["dc.identifier.pmid","27626954"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/39361"],["dc.notes.status","zu prüfen"],["dc.notes.submitter","Najko"],["dc.relation.issn","1530-6992"],["dc.relation.issn","1530-6984"],["dc.relation.orgunit","Institut für Materialphysik"],["dc.title","Suppression of Phase Transformation in Nb-H Thin Films below Switchover Thickness"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]