Danz, Thomas

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[["dc.bibliographiccitation.firstpage","2006"],["dc.bibliographiccitation.issue","S1"],["dc.bibliographiccitation.journal","Microscopy and Microanalysis"],["dc.bibliographiccitation.lastpage","2007"],["dc.bibliographiccitation.volume","24"],["dc.contributor.author","Harvey, Tyler"],["dc.contributor.author","Feist, Armin"],["dc.contributor.author","Möller, Marcel"],["dc.contributor.author","Rubiano da Silva, Nara"],["dc.contributor.author","Bach, Nora"],["dc.contributor.author","Domröse, Till"],["dc.contributor.author","Danz, Thomas"],["dc.contributor.author","Gaida, John H."],["dc.contributor.author","Rittman, Thomas"],["dc.contributor.author","Priebe, Katharina E."],["dc.contributor.author","Schäfer, Sascha"],["dc.contributor.author","Ropers, Claus"],["dc.date.accessioned","2020-06-02T09:41:34Z"],["dc.date.available","2020-06-02T09:41:34Z"],["dc.date.issued","2018"],["dc.identifier.doi","10.1017/S1431927618010516"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/66040"],["dc.relation.issn","1431-9276"],["dc.relation.issn","1435-8115"],["dc.title","Ultrafast Transmission Electron Microscopy with High-Coherence Electron Pulses"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","80"],["dc.bibliographiccitation.lastpage","81"],["dc.contributor.author","Bach, Nora"],["dc.contributor.author","Feist, Armin"],["dc.contributor.author","Domröse, Till"],["dc.contributor.author","Möller, Marcel"],["dc.contributor.author","Rubiano da Silva, Nara"],["dc.contributor.author","Danz, Thomas"],["dc.contributor.author","Schäfer, Sascha"],["dc.contributor.author","Ropers, Claus"],["dc.date.accessioned","2020-02-03T08:49:31Z"],["dc.date.available","2020-02-03T08:49:31Z"],["dc.date.issued","2017"],["dc.description.abstract","We describe the implementation and detailed characterization of a laser-triggered field-emitter electron source integrated into a modified transmission electron microscope. Specifically, localized linear photoemission from the front facet of a tip-shaped ZrO/W(100) Schottky emitter is employed, yielding electron pulses with a spectral bandwidth of 0.6 eV and pulse durations down to 200 fs (full-width-at-half-maximum). Furthermore, transverse electron beam properties are characterized for a range of TEM illumination conditions by caustic measurements of the focused beam in the sample plane of the electron microscope, demonstrating a beam emittance down to 1.8 nm mrad, photoelectron probe sizes below 1 nm and a degree of transverse coherence exceeding 10 %. The electron pulse properties achieved here enable ultrafast high-resolution phase-contrast imaging and Lorentz microscopy, electron holography and spatially-resolved electron spectroscopy, allowing for a comprehensive mapping of ultrafast processes in nanoscale systems."],["dc.identifier.doi","10.1109/IVNC.2017.8051554"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/62924"],["dc.language.iso","en"],["dc.publisher","IEEE"],["dc.relation.conference","2017 30th International Vacuum Nanoelectronics Conference (IVNC)"],["dc.relation.eissn","2380-6311"],["dc.relation.eventend","2017-07-14"],["dc.relation.eventlocation","Regensburg, Germany"],["dc.relation.eventstart","2017-07-10"],["dc.relation.isbn","978-1-5090-3975-3"],["dc.relation.ispartof","30th International Vacuum Nanoelectronics Conference (IVNC)"],["dc.title","Highly coherent femtosecond electron pulses for ultrafast transmission electron microscopy"],["dc.type","conference_paper"],["dc.type.internalPublication","yes"],["dspace.entity.type","Publication"]]