Solid Immersion Facilitates Fluorescence Microscopy with Nanometer Resolution and Sub-Ångström Emitter Localization

ISSN
0935-9648
Date Issued
2012
Author(s)
Wildanger, Dominik
Patton, Brian R.
Marseglia, Luca
Hadden, J. P.
Knauer, Sebastian
Rarity, John G.
O'Brien, J. L.
Smith, Jason M.
DOI
10.1002/adma.201203033
Abstract
Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 +/- 0.3 nm and with a localization precision of 0.09 nm.