Focus characterization of the NanoMAX Kirkpatrick–Baez mirror system

ISSN
1600-5775
Date Issued
2019
Author(s)
Osterhoff, Markus
Eckermann, Marina
Kalbfleisch, Sebastian
Carbone, Dina
Johansson, Ulf
DOI
10.1107/S1600577519003886
Abstract
The focusing and coherence properties of the NanoMAX Kirkpatrick–Baez mirror system at the fourth-generation MAX IV synchrotron in Lund have been characterized. The direct measurement of nano-focused X-ray beams is possible by scanning of an X-ray waveguide, serving basically as an ultra-thin slit. In quasi-coherent operation, beam sizes of down to 56 nm (FWHM, horizontal direction) can be achieved. Comparing measured Airy-like fringe patterns with simulations, the degree of coherence
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