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Near-edge X-ray absorption fine structure measurements using a laser plasma XUV source
ISSN
1742-6596
Date Issued
2009
Author(s)
Peth, Christian
Barkusky, F.
Sedlmair, J.
Gleber, Sophie-Charlotte
Nováková, Eva
Thieme, J.
Mann, K.
DOI
10.1088/1742-6596/186/1/012032
Abstract
We present a compact setup for near-edge x-ray absorption spectroscopy at the carbon K-edge based on a laser-driven plasma source. Thin polymer films were investigated, showing good agreement with corresponding synchrotron data. Furthermore we have examined the carbon near-edge structure of phospholipids and fulvic acids, providing detailed information on intermolecular binding states.
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