Döring, Florian

[["dc.bibliographiccitation.artnumber","UNSP 872"],["dc.bibliographiccitation.issue","10"],["dc.bibliographiccitation.journal","Applied Physics A"],["dc.bibliographiccitation.volume","122"],["dc.contributor.author","Doering, Florian"],["dc.contributor.author","Major, Anna"],["dc.contributor.author","Eberl, Christian"],["dc.contributor.author","Krebs, Hans-Ulrich"],["dc.date.accessioned","2018-11-07T10:07:54Z"],["dc.date.available","2018-11-07T10:07:54Z"],["dc.date.issued","2016"],["dc.description.abstract","Nanoscale thin-film multilayer materials are of great research interest since their large number of interfaces can strongly hinder phonon propagation and lead to a minimized thermal conductivity. When such materials provide a sufficiently small thermal conductivity and feature in addition also a high thermal stability, they would be possible candidates for high-temperature applications such as thermal barrier coatings. For this article, we have used pulsed laser deposition in order to fabricate thin multilayers out of the thermal barrier material ZrO2 in combination with W, which has both a high melting point and high density. Layer thicknesses were designed such that bulk thermal conductivity is governed by the low value of ZrO2, while ultrathin W blocking layers provide a high number of interfaces. By this phonon scattering, reflection and shortening of mean free path lead to a significant reduction in overall thermal conductivity even below the already low value of ZrO2. In addition to this, X-ray reflectivity measurements were taken showing strong Bragg peaks even after annealing such multilayers at 1300 K. Those results identify W/ZrO2 (m)ultilayers as desired thermally stable, low-conductivity materials."],["dc.description.sponsorship","Deutsche Forschungsgemeinschaft [SFB 1073]"],["dc.identifier.doi","10.1007/s00339-016-0405-0"],["dc.identifier.isi","000384753800002"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/39369"],["dc.notes.status","zu prüfen"],["dc.notes.submitter","Najko"],["dc.relation.issn","1432-0630"],["dc.relation.issn","0947-8396"],["dc.relation.orgunit","Institut für Materialphysik"],["dc.title","Minimized thermal conductivity in highly stable thermal barrier W/ZrO2 multilayers"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.issue","1"],["dc.bibliographiccitation.journal","Scientific Reports"],["dc.bibliographiccitation.volume","7"],["dc.contributor.author","Ulrichs, Henning"],["dc.contributor.author","Meyer, Dennis"],["dc.contributor.author","Döring, Florian"],["dc.contributor.author","Eberl, Christian"],["dc.contributor.author","Krebs, Hans Ulrich"],["dc.date.accessioned","2019-07-09T11:43:40Z"],["dc.date.available","2019-07-09T11:43:40Z"],["dc.date.issued","2017"],["dc.description.abstract","We show how the elastic response of metallic nano-cavities can be tailored by tuning the interplay with an underlying phononic superlattice. In particular, we exploit ultrafast optical excitation in order to address a resonance mode in a tungsten thin film, grown on top of a periodic MgO/ZrO2 multilayer. Setting up a simple theoretical model, we can explain our findings by the coupling of the resonance in the tungsten to an evanescent surface mode of the superlattice. To demonstrate a second potential benefit of our findings besides characterization of elastic properties of multilayer samples, we show by micromagnetic simulation how a similar structure can be utilized for magneto-elastic excitation of exchange-dominated spin waves."],["dc.description.sponsorship","Open-Access-Publikationsfonds 2017"],["dc.identifier.doi","10.1038/s41598-017-11099-y"],["dc.identifier.purl","https://resolver.sub.uni-goettingen.de/purl?gs-1/14621"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/58943"],["dc.language.iso","en"],["dc.notes.intern","Merged from goescholar"],["dc.relation","SFB 1073: Kontrolle von Energiewandlung auf atomaren Skalen"],["dc.relation","SFB 1073 | Topical Area A | A02 Verständnis und Manipulation von Dissipationskanälen des Energietransports"],["dc.relation.issn","2045-2322"],["dc.relation.orgunit","Fakultät für Physik"],["dc.relation.orgunit","Institut für Materialphysik"],["dc.rights","CC BY 4.0"],["dc.subject.ddc","530"],["dc.title","Spectral control of elastic dynamics in metallic nano-cavities"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.subtype","original_ja"],["dc.type.version","published_version"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","19311"],["dc.bibliographiccitation.issue","16"],["dc.bibliographiccitation.journal","Optics Express"],["dc.bibliographiccitation.lastpage","19323"],["dc.bibliographiccitation.volume","21"],["dc.contributor.author","Döring, Florian"],["dc.contributor.author","Robisch, Anna-Lena"],["dc.contributor.author","Eberl, Christian"],["dc.contributor.author","Osterhoff, Markus"],["dc.contributor.author","Ruhlandt, Aike"],["dc.contributor.author","Liese, Tobias"],["dc.contributor.author","Schlenkrich, Felix"],["dc.contributor.author","Hoffmann, S."],["dc.contributor.author","Bartels, Matthias"],["dc.contributor.author","Salditt, Tim"],["dc.contributor.author","Krebs, Hans-Ulrich"],["dc.date.accessioned","2020-11-05T15:05:23Z"],["dc.date.available","2020-11-05T15:05:23Z"],["dc.date.issued","2013"],["dc.description.abstract","Compound optics such as lens systems can overcome the limitations concerning resolution, efficiency, or aberrations which fabrication constraints would impose on any single optical element. In this work we demonstrate unprecedented sub-5 nm point focusing of hard x-rays, based on the combination of a high gain Kirkpatrick-Baez (KB) mirror system and a high resolution W/Si multilayer zone plate (MZP) for ultra-short focal length f. The pre-focusing allows limiting the MZP radius to below 2 mu m, compatible with the required 5 nm structure width and essentially unlimited aspect ratios, provided by enabling fabrication technology based on pulsed laser deposition (PLD) and focused ion beam (FIB). (c) 2013 Optical Society of America"],["dc.identifier.doi","10.1364/OE.21.019311"],["dc.identifier.gro","3142308"],["dc.identifier.isi","000323049900072"],["dc.identifier.pmid","23938848"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/68456"],["dc.language.iso","en"],["dc.notes.intern","DOI Import GROB-352.6"],["dc.notes.status","final"],["dc.notes.submitter","PUB_WoS_Import"],["dc.relation","SFB 755: Nanoscale Photonic Imaging"],["dc.relation.eissn","1094-4087"],["dc.relation.issn","1094-4087"],["dc.relation.orgunit","Institut für Materialphysik"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray optics"],["dc.title","Sub-5 nm hard x-ray point focusing by a combined Kirkpatrick-Baez mirror and multilayer zone plate"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]

[["dc.contributor.author","Osterhoff, Markus"],["dc.contributor.author","Döring, Florian"],["dc.contributor.author","Eberl, Christian"],["dc.contributor.author","Wilke, Robin N."],["dc.contributor.author","Wallentin, Jesper"],["dc.contributor.author","Krebs, Hans-Ulrich"],["dc.contributor.author","Sprung, Michael"],["dc.contributor.author","Salditt, Tim"],["dc.date.accessioned","2017-09-07T11:54:07Z"],["dc.date.available","2017-09-07T11:54:07Z"],["dc.date.issued","2015"],["dc.identifier.doi","10.1117/12.2187799"],["dc.identifier.gro","3145110"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/2810"],["dc.notes.intern","Crossref Import"],["dc.notes.status","public"],["dc.publisher","SPIE"],["dc.publisher.place","Bellingham, Wash."],["dc.relation","SFB 755: Nanoscale Photonic Imaging"],["dc.relation.conference","X-ray nanoimaging: instruments and methods"],["dc.relation.eventend","2015-08-13"],["dc.relation.eventlocation","San Diego, Calif."],["dc.relation.eventstart","2015-08-12"],["dc.relation.isbn","978-1-62841-758-6"],["dc.relation.ispartof","X-ray nanoimaging: instruments and methods II: 12 - 13 August 2015, San Diego, California, United States"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray optics"],["dc.subject.gro","x-ray imaging"],["dc.title","Progress on multi-order hard x-ray imaging with multilayer zone plates"],["dc.type","conference_paper"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","no"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","1266"],["dc.bibliographiccitation.issue","4"],["dc.bibliographiccitation.journal","Journal of Synchrotron Radiation"],["dc.bibliographiccitation.lastpage","1271"],["dc.bibliographiccitation.volume","26"],["dc.contributor.author","Döring, Florian"],["dc.contributor.author","Risch, Marcel"],["dc.contributor.author","Rösner, Benedikt"],["dc.contributor.author","Beye, Martin"],["dc.contributor.author","Busse, Philipp"],["dc.contributor.author","Kubiček, Katharina"],["dc.contributor.author","Glaser, Leif"],["dc.contributor.author","Miedema, Piter S."],["dc.contributor.author","Soltau, Jakob"],["dc.contributor.author","Raiser, Dirk"],["dc.contributor.author","Guzenko, Vitaliy A."],["dc.contributor.author","Szabadics, Lukas"],["dc.contributor.author","Kochanneck, Leif"],["dc.contributor.author","Baumung, Max"],["dc.contributor.author","Buck, Jens"],["dc.contributor.author","Jooss, Christian"],["dc.contributor.author","Techert, Simone"],["dc.contributor.author","David, Christian"],["dc.date.accessioned","2020-12-10T18:25:59Z"],["dc.date.available","2020-12-10T18:25:59Z"],["dc.date.issued","2019"],["dc.description.abstract","X-ray absorption spectroscopy (XAS) is a powerful element-specific technique that allows the study of structural and chemical properties of matter. Often an indirect method is used to access the X-ray absorption (XA). This work demonstrates a new XAS implementation that is based on off-axis transmission Fresnel zone plates to obtain the XA spectrum of La0.6Sr0.4MnO3 by analysis of three emission lines simultaneously at the detector, namely the O 2p-1s, Mn 3s-2p and Mn 3d-2p transitions. This scheme allows the simultaneous measurement of an integrated total fluorescence yield and the partial fluorescence yields (PFY) of the Mn 3s-2p and Mn 3d-2p transitions when scanning the Mn L-edge. In addition to this, the reduction in O fluorescence provides another measure for absorption often referred to as the inverse partial fluorescence yield (IPFY). Among these different methods to measure XA, the Mn 3s PFY and IPFY deviate the least from the true XA spectra due to the negligible influence of selection rules on the decay channel. Other advantages of this new scheme are the potential to strongly increase the efficiency and throughput compared with similar measurements using conventional gratings and to increase the signal-to-noise of the XA spectra as compared with a photodiode. The ability to record undistorted bulk XA spectra at high flux is crucial for future in situ spectroscopy experiments on complex materials."],["dc.identifier.doi","10.1107/S1600577519003898"],["dc.identifier.issn","1600-5775"],["dc.identifier.pmid","31274453"],["dc.identifier.purl","https://resolver.sub.uni-goettingen.de/purl?gs-1/16305"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/75901"],["dc.language.iso","en"],["dc.notes.intern","DOI Import GROB-354"],["dc.relation","SFB 1073: Kontrolle von Energiewandlung auf atomaren Skalen"],["dc.relation","SFB 1073 | Topical Area C | C02 In situ hochauflösende Untersuchung des aktiven Zustands bei der photo- und elektrochemischen Wasserspaltung"],["dc.relation","SFB 1073 | Topical Area C | C05 Kontrolle Elektronen-getriebener Chemie durch Interkalation"],["dc.relation.eissn","1600-5775"],["dc.relation.issn","1600-5775"],["dc.relation.orgunit","Institut für Materialphysik"],["dc.relation.workinggroup","RG Techert (Structural Dynamics in Chemical Systems)"],["dc.title","A zone-plate-based two-color spectrometer for indirect X-ray absorption spectroscopy"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","431"],["dc.bibliographiccitation.issue","2"],["dc.bibliographiccitation.journal","Applied Physics A"],["dc.bibliographiccitation.lastpage","437"],["dc.bibliographiccitation.volume","111"],["dc.contributor.author","Eberl, Christian"],["dc.contributor.author","Liese, Tobias"],["dc.contributor.author","Schlenkrich, Felix"],["dc.contributor.author","Doering, Florian"],["dc.contributor.author","Hofsaess, Hans C."],["dc.contributor.author","Krebs, Hans-Ulrich"],["dc.date.accessioned","2018-11-07T09:25:02Z"],["dc.date.available","2018-11-07T09:25:02Z"],["dc.date.issued","2013"],["dc.description.abstract","During growth of multilayers by pulsed laser deposition (PLD), often both intermixing and resputtering occur due to the high kinetic energy of the particles transferred from the target to the substrate surface. In order to obtain a fundamental understanding of the underlying processes, W/Si multilayers have been studied by the complementary methods of transmission electron microscopy (TEM), X-ray reflectivity (XRR) and in-situ rate monitoring. For the experiments, deposition conditions were chosen that result in high energetic Si ions and mainly low energetic W atoms for the multilayer growth. Under these conditions, interface mixing of up to 3 nm occurs at the W/Si interfaces, while the Si/W interfaces remain sharp. Furthermore, enhanced resputtering of Si leads to a Si thickness deficit of up to 2 nm at the W/Si interfaces. The presented results can be understood by a combination of theoretical calculations as well as SRIM and TRIDYN simulations, which match perfectly to the experimentally obtained intermixing and enhanced resputtering of Si at the W/Si interfaces."],["dc.description.sponsorship","Deutsche Forschungsgemeinschaft [SFB 755, SFB 602]"],["dc.identifier.doi","10.1007/s00339-013-7587-5"],["dc.identifier.fs","600423"],["dc.identifier.isi","000319064800013"],["dc.identifier.purl","https://resolver.sub.uni-goettingen.de/purl?gs-1/10294"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/29975"],["dc.notes.intern","Merged from goescholar"],["dc.notes.status","zu prüfen"],["dc.notes.submitter","Najko"],["dc.relation.issn","0947-8396"],["dc.relation.orgunit","Fakultät für Physik"],["dc.relation.orgunit","Institut für Materialphysik"],["dc.rights.uri","https://goedoc.uni-goettingen.de/licenses"],["dc.title","Enhanced resputtering and asymmetric interface mixing in W/Si multilayers"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.subtype","original_ja"],["dc.type.version","published_version"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","116"],["dc.bibliographiccitation.issue","1"],["dc.bibliographiccitation.journal","Journal of Applied Crystallography"],["dc.bibliographiccitation.lastpage","124"],["dc.bibliographiccitation.volume","48"],["dc.contributor.author","Osterhoff, Markus"],["dc.contributor.author","Eberl, Christian"],["dc.contributor.author","Döring, Florian"],["dc.contributor.author","Wilke, Robin N."],["dc.contributor.author","Wallentin, Jesper"],["dc.contributor.author","Krebs, Hans Ulrich"],["dc.contributor.author","Sprung, Michael"],["dc.contributor.author","Salditt, Tim"],["dc.date.accessioned","2020-11-05T15:05:24Z"],["dc.date.available","2020-11-05T15:05:24Z"],["dc.date.issued","2015"],["dc.description.abstract","This article describes holographic imaging experiments using a hard X-ray multilayer zone plate (MZP) with an outermost zone width of 10nm at a photon energy of 18keV. An order-sorting aperture (OSA) is omitted and emulated during data analysis by a 'software OSA'. Scanning transmission X-ray microscopy usually carried out in the focal plane is generalized to the holographic regime. The MZP focus is characterized by a three-plane phase-retrieval algorithm to an FWHM of 10nm."],["dc.identifier.doi","10.1107/S1600576714026016"],["dc.identifier.gro","3141965"],["dc.identifier.isi","000349210700016"],["dc.identifier.purl","https://resolver.sub.uni-goettingen.de/purl?gs-1/13802"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/68460"],["dc.language.iso","en"],["dc.notes.intern","DOI Import GROB-352.6"],["dc.notes.status","final"],["dc.notes.submitter","PUB_WoS_Import"],["dc.relation","SFB 755: Nanoscale Photonic Imaging"],["dc.relation.eissn","1600-5767"],["dc.relation.issn","1600-5767"],["dc.relation.orgunit","Institut für Materialphysik"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.rights.uri","https://goedoc.uni-goettingen.de/licenses"],["dc.subject.gro","x-ray optics"],["dc.subject.gro","x-ray imaging"],["dc.title","Towards multi-order hard X-ray imaging with multilayer zone plates"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.subtype","original_ja"],["dc.type.version","published_version"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.artnumber","884802"],["dc.bibliographiccitation.volume","8848"],["dc.contributor.author","Osterhoff, Markus"],["dc.contributor.author","Bartels, Matthias"],["dc.contributor.author","Döring, Florian"],["dc.contributor.author","Eberl, Christian"],["dc.contributor.author","Hoinkes, Thomas"],["dc.contributor.author","Hoffmann-Urlaub, Sarah"],["dc.contributor.author","Liese, Tobias"],["dc.contributor.author","Radisch, Volker"],["dc.contributor.author","Rauschenbeutel, Arno"],["dc.contributor.author","Robisch, Anna Lena"],["dc.contributor.author","Ruhlandt, Aike"],["dc.contributor.author","Schlenkrich, Felix"],["dc.contributor.author","Salditt, Tim"],["dc.contributor.author","Krebs, Hans Ulrich"],["dc.contributor.editor","Goto, Shunji"],["dc.contributor.editor","Morawe, Christian"],["dc.contributor.editor","Khounsary, Ali"],["dc.date.accessioned","2020-02-24T13:39:51Z"],["dc.date.available","2020-02-24T13:39:51Z"],["dc.date.issued","2013"],["dc.description.abstract","We present experiments carried out using a combined hard x-ray focusing set-up preserving the benefits of a large-aperture Kirckpatrick-Baez (KB) mirror system and a small focal length multilayer zone plane (MZP). The high gain KB mirrors produce a pre-focus of 400 nm × 200 nm; in their defocus, two MZP lenses of diameter of 1.6 μm and 3.7 μm have been placed, with focal lengths of 50 μm and 250 μm respectively. The lenses have been produced using pulsed laser deposition (PLD) and focused ion beam (FIB). Forward simulations including error models based on measured deviations, auto-correlation analysis and three-plane phase reconstruction support two-dimensional focus sizes of 4.3 nm × 4.7 nm (7:9 keV, W/Si)1 and 4.3 nm ×5.9 nm (13:8 keV, W/ZrO2), respectively."],["dc.identifier.doi","10.1117/12.2025389"],["dc.identifier.gro","3145113"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/2814"],["dc.language.iso","en"],["dc.notes.intern","Crossref Import"],["dc.notes.status","final"],["dc.relation.conference","SPIE"],["dc.relation.crisseries","Proceedings of SPIE"],["dc.relation.eventend","2013-08-28"],["dc.relation.eventlocation","San Diego"],["dc.relation.eventstart","2013"],["dc.relation.isbn","978-0-8194-9698-0"],["dc.relation.ispartof","Advances in X-ray/EUV optics and components VIII"],["dc.relation.ispartofseries","Proceedings of SPIE; 8848"],["dc.relation.issn","0277-786X"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray optics"],["dc.title","Two-dimensional sub-5-nm hard x-ray focusing with MZP"],["dc.type","conference_paper"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","no"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","958808"],["dc.bibliographiccitation.volume","9588"],["dc.contributor.author","Eberl, Christian"],["dc.contributor.author","Osterhoff, Markus"],["dc.contributor.author","Döring, Florian"],["dc.contributor.author","Krebs, Hans Ulrich"],["dc.contributor.editor","Goto, Shunji"],["dc.contributor.editor","Morawe, Christian"],["dc.contributor.editor","Khounsary, Ali M."],["dc.date.accessioned","2020-02-24T13:33:00Z"],["dc.date.available","2020-02-24T13:33:00Z"],["dc.date.issued","2015"],["dc.identifier.doi","10.1117/12.2187788"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/63008"],["dc.notes.preprint","yes"],["dc.relation","SFB 755: Nanoscale Photonic Imaging"],["dc.relation.conference","SPIE"],["dc.relation.eventlocation","San Diego"],["dc.relation.eventstart","2015"],["dc.relation.iserratumof","yes"],["dc.relation.issn","0277-786X"],["dc.subject.gro","x-ray optics and imaging"],["dc.title","MZP design and fabrication for efficient hard x-ray nano-focusing and imaging"],["dc.type","conference_paper"],["dc.type.internalPublication","yes"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.issue","1"],["dc.bibliographiccitation.journal","Scientific Reports"],["dc.bibliographiccitation.volume","7"],["dc.contributor.author","Marschall, Felix"],["dc.contributor.author","Yin, Zhong"],["dc.contributor.author","Rehanek, Jens"],["dc.contributor.author","Beye, Martin"],["dc.contributor.author","Döring, Florian"],["dc.contributor.author","Kubicek, Katharina"],["dc.contributor.author","Raiser, Dirk"],["dc.contributor.author","Thekku Veedu, Sreevidya"],["dc.contributor.author","Buck, Jens"],["dc.contributor.author","Rothkirch, André"],["dc.contributor.author","Rösner, Benedikt"],["dc.contributor.author","Guzenko, Vitaliy A."],["dc.contributor.author","Viefhaus, Jens"],["dc.contributor.author","Christian, David"],["dc.contributor.author","Techert, Simone"],["dc.date.accessioned","2019-07-09T11:43:49Z"],["dc.date.available","2019-07-09T11:43:49Z"],["dc.date.issued","2017"],["dc.identifier.doi","10.1038/s41598-017-09052-0"],["dc.identifier.pmid","28821805"],["dc.identifier.purl","https://resolver.sub.uni-goettingen.de/purl?gs-1/14686"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/58975"],["dc.language.iso","en"],["dc.notes.intern","Merged from goescholar"],["dc.relation","info:eu-repo/grantAgreement/EC/H2020/654360/EU//NFFA-Europe"],["dc.relation","SFB 1073: Kontrolle von Energiewandlung auf atomaren Skalen"],["dc.relation","SFB 1073 | Topical Area C | C02 In situ hochauflösende Untersuchung des aktiven Zustands bei der photo- und elektrochemischen Wasserspaltung"],["dc.relation.orgunit","Fakultät für Physik"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Techert (Structural Dynamics in Chemical Systems)"],["dc.rights","CC BY 4.0"],["dc.title","Transmission zone plates as analyzers for efficient parallel 2D RIXS-mapping"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]