Metzger, Till Hartmut

[["dc.bibliographiccitation.seriesnr","1355"],["dc.contributor.author","Salditt, Tim"],["dc.contributor.author","Metzger, T. H."],["dc.contributor.author","Peisl, J."],["dc.contributor.author","Morawe, C. H."],["dc.contributor.author","Zabel, H."],["dc.date.accessioned","2017-09-07T11:54:11Z"],["dc.date.available","2017-09-07T11:54:11Z"],["dc.date.issued","2011"],["dc.identifier.doi","10.1557/proc-355-269"],["dc.identifier.gro","3145131"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/2833"],["dc.notes.intern","Crossref Import"],["dc.notes.status","public"],["dc.publisher","Cambridge University Press (CUP)"],["dc.publisher.place","New York"],["dc.relation.conference","Symposium JJ, Biological Hybrid Materials for Life Sciences"],["dc.relation.crisseries","Materials Research Society Symposium Proceedings"],["dc.relation.eventend","2011-04-29"],["dc.relation.eventlocation","San Francisco, Calif."],["dc.relation.eventstart","2011-04-25"],["dc.relation.isbn","978-1-62748-200-4"],["dc.relation.ispartof","Biological hybrid materials for life sciences"],["dc.relation.ispartofseries","Materials Research Society symposium proceedings; 1355"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray scattering"],["dc.title","Interface Morphology of RF-Sputtered NB/AL2O3 Multilayers Studied by X-Ray Reflectivity and Diffuse Scattering"],["dc.type","conference_paper"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","no"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","C470"],["dc.bibliographiccitation.issue","a1"],["dc.bibliographiccitation.journal","Acta Crystallographica. Section A, Foundations and Advances"],["dc.bibliographiccitation.lastpage","C470"],["dc.bibliographiccitation.volume","52"],["dc.contributor.author","Metzger, Till Hartmut"],["dc.contributor.author","Salditt, Tim"],["dc.contributor.author","Lott, D"],["dc.contributor.author","Peisl, J."],["dc.date.accessioned","2020-03-11T10:40:01Z"],["dc.date.available","2020-03-11T10:40:01Z"],["dc.date.issued","1996"],["dc.identifier.doi","10.1107/S0108767396080737"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/63302"],["dc.language.iso","en"],["dc.relation.issn","0108-7673"],["dc.title","Diffuse X-ray scattering from rough interfaces in sputtered W/Si multilayers"],["dc.type","journal_article"],["dc.type.internalPublication","unknown"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","5860"],["dc.bibliographiccitation.issue","8"],["dc.bibliographiccitation.journal","Physical Review B"],["dc.bibliographiccitation.lastpage","5872"],["dc.bibliographiccitation.volume","54"],["dc.contributor.author","Salditt, Tim"],["dc.contributor.author","Lott, D."],["dc.contributor.author","Metzger, T. H."],["dc.contributor.author","Peisl, J"],["dc.contributor.author","Vignaud, G."],["dc.contributor.author","Hoghoj, Peter"],["dc.contributor.author","Scharpf, O."],["dc.contributor.author","Hinze, P"],["dc.contributor.author","Lauer, R."],["dc.date.accessioned","2017-09-07T11:51:06Z"],["dc.date.available","2017-09-07T11:51:06Z"],["dc.date.issued","1996"],["dc.description.abstract","We have studied interfacial roughness in amorphous W/Si multilayers grown by rf sputtering at different deposition parameters by cross-sectional transmission electron microscopy, x-ray reflectivity, and diffuse x-ray scattering. The diffuse scattering intensity has been recorded in an unprecedented wide range of parallel momentum transfer, 5x10(-4) Angstrom(-1)less than or equal to q(parallel to)less than or equal to 1 Angstrom(-1), giving access to the height-height self- and cross-correlation functions on lateral length scales between a few Angstrom and 1 mu m. The results are compared for the different samples and discussed in view of the deposition parameters."],["dc.identifier.doi","10.1103/PhysRevB.54.5860"],["dc.identifier.gro","3144639"],["dc.identifier.isi","A1996VF92900092"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/2285"],["dc.notes.intern","WoS Import 2017-03-10"],["dc.notes.status","final"],["dc.notes.submitter","PUB_WoS_Import"],["dc.relation.issn","0163-1829"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray scattering"],["dc.title","Interfacial roughness and related growth mechanisms in sputtered W/Si multilayers"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","1890"],["dc.bibliographiccitation.issue","10"],["dc.bibliographiccitation.journal","Physical Review Letters"],["dc.bibliographiccitation.lastpage","1890"],["dc.bibliographiccitation.volume","74"],["dc.contributor.author","Salditt, T."],["dc.contributor.author","Metzger, T. H."],["dc.contributor.author","Peisl, J."],["dc.date.accessioned","2022-06-08T08:00:06Z"],["dc.date.available","2022-06-08T08:00:06Z"],["dc.date.issued","1995"],["dc.identifier.doi","10.1103/PhysRevLett.74.1890.2"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/110961"],["dc.language.iso","en"],["dc.notes.intern","DOI-Import GROB-575"],["dc.relation.eissn","1079-7114"],["dc.relation.issn","0031-9007"],["dc.title","Kinetic Roughness of Amorphous Multilayers Studied by Diffuse X-Ray Scattering"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","5179"],["dc.bibliographiccitation.issue","10"],["dc.bibliographiccitation.journal","Journal of Applied Physics"],["dc.bibliographiccitation.lastpage","5184"],["dc.bibliographiccitation.volume","83"],["dc.contributor.author","Salditt, T."],["dc.contributor.author","Metzger, T. H."],["dc.contributor.author","Peisl, J."],["dc.contributor.author","Feidenhans'L, R."],["dc.date.accessioned","2017-09-07T11:48:10Z"],["dc.date.available","2017-09-07T11:48:10Z"],["dc.date.issued","1998"],["dc.description.abstract","We have measured the structure factor of diffuse scattering and amorphous scattering in a W/Si multilayer under simultaneous excitation of x-ray standing waves. The tuning of the nodes and antinodes to the location of the W and Si sublayers or to the respective interfaces increases the selective sensitivity to the structure of the respective sublayer or interface. The dynamically broadened first multilayer Bragg peak is modeled by the Darwin theory of dynamic diffraction, which allows for the exact determination of the standing wave phase. The decay of diffuse intensity, as measured in a grazing incidence geometry at different standing wave phase shifts, indicates that the height-height self-correlation function is of the same form for both types of interfaces, W/Si and Si/W. The amorphous peaks of the Si sublayer can only be observed if the angles of incidence and exit are optimized to suppress the scattering from the otherwise dominating W layers. The peak positions are the same as for bulk amorphous silicon. (C) 1998 American Institute of Physics."],["dc.identifier.doi","10.1063/1.367337"],["dc.identifier.gro","3144549"],["dc.identifier.isi","000073773600024"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/2185"],["dc.language.iso","en"],["dc.notes.intern","WoS Import 2017-03-10"],["dc.notes.status","final"],["dc.notes.submitter","PUB_WoS_Import"],["dc.relation.issn","0021-8979"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray scattering"],["dc.title","Elastic scattering under simultaneous excitation of x-ray standing waves in multilayers"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","34"],["dc.bibliographiccitation.issue","1-2"],["dc.bibliographiccitation.lastpage","38"],["dc.bibliographiccitation.volume","357"],["dc.contributor.author","Khattari, Ziad"],["dc.contributor.author","Brotons, Guillaume"],["dc.contributor.author","Arbely, E"],["dc.contributor.author","Arkin, I. T."],["dc.contributor.author","Metzger, T. H."],["dc.contributor.author","Salditt, Tim"],["dc.date.accessioned","2017-09-07T11:54:32Z"],["dc.date.available","2017-09-07T11:54:32Z"],["dc.date.issued","2005"],["dc.description.abstract","We report on an anomalous X-ray reflectivity study to locate a labelled residue of a membrane protein with respect to the lipid bilayer. From such experiments, important constraints on the protein or peptide conformation can be derived. Specifically, our aim is to localize an iodine-labelled phenylalanine in the SARS E protein, incorporated in DMPC phospholipid bilayers, which are deposited in the form of thick multilamellar stacks on silicon surfaces. Here, we discuss the experimental aspects and the difficulties associated with the Fourier synthesis analysis that gives the electron density profile of the membranes. (C) 2004 Elsevier B.V. All rights reserved."],["dc.identifier.doi","10.1016/j.physb.2004.11.015"],["dc.identifier.gro","3143885"],["dc.identifier.isi","000227309100008"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/1448"],["dc.notes.intern","WoS Import 2017-03-10"],["dc.notes.status","final"],["dc.notes.submitter","PUB_WoS_Import"],["dc.publisher","Elsevier Science Bv"],["dc.publisher.place","Amsterdam"],["dc.relation.eissn","1873-2135"],["dc.relation.eventlocation","Bad Honnef, GERMANY"],["dc.relation.ispartof","Physica B: Condensed Matter"],["dc.relation.issn","0921-4526"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray scattering"],["dc.subject.gro","membrane biophysics"],["dc.title","SARS E protein in phospholipid bilayers: an anomalous X-ray reflectivity study"],["dc.type","conference_paper"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","C464"],["dc.bibliographiccitation.issue","a1"],["dc.bibliographiccitation.journal","Acta Crystallographica. Section A, Foundations and Advances"],["dc.bibliographiccitation.lastpage","C464"],["dc.bibliographiccitation.volume","52"],["dc.contributor.author","Salditt, Tim"],["dc.contributor.author","Metzger, Till Hartmut"],["dc.contributor.author","Lott, D"],["dc.contributor.author","Peisl, J."],["dc.date.accessioned","2020-03-11T10:38:56Z"],["dc.date.available","2020-03-11T10:38:56Z"],["dc.date.issued","1996"],["dc.identifier.doi","10.1107/S0108767396080981"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/63301"],["dc.language.iso","en"],["dc.relation.issn","0108-7673"],["dc.title","Interface roughness in sputtered W/Si multilayers and related growth models"],["dc.type","journal_article"],["dc.type.internalPublication","unknown"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","13"],["dc.bibliographiccitation.issue","1"],["dc.bibliographiccitation.lastpage","17"],["dc.bibliographiccitation.volume","221"],["dc.contributor.author","Salditt, Tim"],["dc.contributor.author","Lott, D."],["dc.contributor.author","Metzger, T. H."],["dc.contributor.author","Peisl, J"],["dc.contributor.author","Vignaud, G."],["dc.contributor.author","Legrand, J. F."],["dc.contributor.author","Grubel, G"],["dc.contributor.author","Hoghoj, Peter"],["dc.contributor.author","Scharpf, O."],["dc.date.accessioned","2017-09-07T11:51:09Z"],["dc.date.available","2017-09-07T11:51:09Z"],["dc.date.issued","1996"],["dc.description.abstract","We present the first high resolution measurements of diffuse scattering from interface roughness in multilayers. The example of an amorphous W/Si multilayer is taken to illustrate the technique and the approach followed in the data evaluation. The scattering intensity under grazing incidence and exit has been recorded with an Si(220) analyzer crystal to improve the resolution perpendicular to the plane of reflection. The structure factor of the interfaces is determined over a range of more than three decades in parallel momentum transfer, while covering up to five Bragg sheets simultaneously along the exit angle. Hence, the interface roughness is probed on lateral length scales between a few Angstrom and more than one mu m."],["dc.identifier.doi","10.1016/0921-4526(95)00899-3"],["dc.identifier.gro","3144656"],["dc.identifier.isi","A1996UR27700004"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/2304"],["dc.notes.intern","WoS Import 2017-03-10"],["dc.notes.status","final"],["dc.notes.submitter","PUB_WoS_Import"],["dc.publisher","Elsevier Science Bv"],["dc.publisher.place","Amsterdam"],["dc.relation.eventlocation","LAKE GENEVA, WI"],["dc.relation.ispartof","Physica B: Condensed Matter"],["dc.relation.issn","0921-4526"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray scattering"],["dc.title","Characterization of interface roughness in W/Si multilayers by high resolution diffuse X-ray scattering"],["dc.type","conference_paper"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","1573"],["dc.bibliographiccitation.issue","9"],["dc.bibliographiccitation.journal","Journal de Physique. III"],["dc.bibliographiccitation.lastpage","1580"],["dc.bibliographiccitation.volume","4"],["dc.contributor.author","Salditt, Tim"],["dc.contributor.author","Metzger, Till Hartmut"],["dc.contributor.author","Peisl, J."],["dc.contributor.author","Jiang, Xiangning"],["dc.date.accessioned","2017-09-07T11:51:25Z"],["dc.date.available","2017-09-07T11:51:25Z"],["dc.date.issued","1994"],["dc.description.abstract","We present a new method to measure the diffuse scattering of amorphous multilayers. In contrast to conventional scans, that all take place in the plane of reflection, in this out-of-plane scattering geometry the accessible range in parallel momentum transfer Q(parallel-to) is not limited by the sample surface. We can therefore record data continuously from very small Q(parallel-to) up to Q(parallel-to) congruent-to 2pi/lambda, holding Q(perpendicular-to) constant at the same time. We thereby obtain a scattering factor S(Q) of our sample, that can easily be attributed to diffuse scattering at rough interfaces or amorphous bulk, respectively. In the case of the W/C amorphous multilayer studied here, the data show that the contribution of amorphous scattering is less than 2% up to about Q(parallel-to) = 0.1 angstrom-1, and becomes dominant only in the wide angle region. This allows to draw the conclusion, that the Bragg sheets observed in the vicinity of the specular condition are mainly due to conformal roughness of the multilayer interfaces."],["dc.identifier.doi","10.1051/jp3:1994224"],["dc.identifier.gro","3144722"],["dc.identifier.isi","A1994PH37300009"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/2377"],["dc.notes.intern","WoS Import 2017-03-10"],["dc.notes.status","zu prüfen"],["dc.notes.submitter","PUB_WoS_Import"],["dc.relation.issn","1155-4320"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray scattering"],["dc.title","Diffuse X-ray scattering of amorphous multilayers"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","359"],["dc.bibliographiccitation.issue","4"],["dc.bibliographiccitation.journal","Journal of Physics D: Applied Physics"],["dc.bibliographiccitation.lastpage","368"],["dc.bibliographiccitation.volume","32"],["dc.contributor.author","Kovats, Z."],["dc.contributor.author","Salditt, Tim"],["dc.contributor.author","Metzger, T. H."],["dc.contributor.author","Peisl, J"],["dc.contributor.author","Stimpel, T."],["dc.contributor.author","Lorenz, Holger"],["dc.contributor.author","Chu, J. O."],["dc.contributor.author","Ismail, K."],["dc.date.accessioned","2017-09-07T11:47:34Z"],["dc.date.available","2017-09-07T11:47:34Z"],["dc.date.issued","1999"],["dc.description.abstract","We have studied the interface morphology of a strained and of a relaxed Si1-xGex layer system grown on top of a relaxed Si0.7Ge0.3 buffer on a Si(001) substrate. The strain state of the layers was determined by grazing incidence diffraction(GID). Surfaces have been investigated by atomic force microscopy (AFM) and exhibit anisotropies of RMS roughness and lateral correlation length along the [110] and [100] directions, which are parallel and diagonal to the cross-hatch pattern, respectively. Diffuse x-ray scattering under grazing incidence and exit close to the forwards direction revealed conformal roughness of the interfaces at lateral correlation lengths of about 1 mu m. To deal with the large RMS roughness of up to 40 Angstrom, the concept of interfaces without a lateral cut-off length was used to describe the diffuse x-ray scattering within the Born approximation. In the case of a relaxed layer, additional roughness on a lateral length scale of 30 nm was observed at a buried interface by diffuse scattering out of the plane of incidence."],["dc.identifier.doi","10.1088/0022-3727/32/4/002"],["dc.identifier.gro","3144490"],["dc.identifier.isi","000079052500002"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/2119"],["dc.notes.intern","WoS Import 2017-03-10"],["dc.notes.status","final"],["dc.notes.submitter","PUB_WoS_Import"],["dc.relation.issn","0022-3727"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray scattering"],["dc.title","Interface morphology in strained layer epitaxy of Si/Si1-xGex layers studied by x-ray scattering under grazing incidence and atomic force microscopy"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]