Robisch, Anna Lena

[["dc.bibliographiccitation.firstpage","18440"],["dc.bibliographiccitation.issue","15"],["dc.bibliographiccitation.journal","Optics express"],["dc.bibliographiccitation.lastpage","53"],["dc.bibliographiccitation.volume","22"],["dc.contributor.author","Keskinbora, Kahraman"],["dc.contributor.author","Robisch, Anna Lena"],["dc.contributor.author","Mayer, Marcel"],["dc.contributor.author","Sanli, Umut T."],["dc.contributor.author","Grévent, Corinne"],["dc.contributor.author","Wolter, Christian"],["dc.contributor.author","Weigand, Markus"],["dc.contributor.author","Szeghalmi, Adriana V."],["dc.contributor.author","Knez, Mato"],["dc.contributor.author","Salditt, Tim"],["dc.contributor.author","Schütz, Gisela"],["dc.date.accessioned","2019-07-10T08:11:56Z"],["dc.date.available","2019-07-10T08:11:56Z"],["dc.date.issued","2014-07-28"],["dc.description.abstract","X-ray microscopy is a successful technique with applications in several key fields. Fresnel zone plates (FZPs) have been the optical elements driving its success, especially in the soft X-ray range. However, focusing of hard X-rays via FZPs remains a challenge. It is demonstrated here, that two multilayer type FZPs, delivered from the same multilayer deposit, focus both hard and soft X-rays with high fidelity. The results prove that these lenses can achieve at least 21 nm half-pitch resolution at 1.2 keV demonstrated by direct imaging, and sub-30 nm FWHM (full-pitch) resolution at 7.9 keV, deduced from autocorrelation analysis. Reported FZPs had more than 10% diffraction efficiency near 1.5 keV."],["dc.identifier.pmid","25089463"],["dc.identifier.purl","https://resolver.sub.uni-goettingen.de/purl?gs-1/12649"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/60824"],["dc.language.iso","en"],["dc.relation.issn","1094-4087"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray optics"],["dc.subject.gro","x-ray imaging"],["dc.title","Multilayer Fresnel zone plates for high energy radiation resolve 21 nm features at 1.2 keV."],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.subtype","original_ja"],["dc.type.version","published_version"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","1173"],["dc.bibliographiccitation.issue","4"],["dc.bibliographiccitation.journal","Journal of Synchrotron Radiation"],["dc.bibliographiccitation.lastpage","1180"],["dc.bibliographiccitation.volume","26"],["dc.contributor.author","Osterhoff, Markus"],["dc.contributor.author","Robisch, Anna-Lena"],["dc.contributor.author","Soltau, Jakob"],["dc.contributor.author","Eckermann, Marina"],["dc.contributor.author","Kalbfleisch, Sebastian"],["dc.contributor.author","Carbone, Dina"],["dc.contributor.author","Johansson, Ulf"],["dc.contributor.author","Salditt, Tim"],["dc.date.accessioned","2020-12-10T18:25:59Z"],["dc.date.available","2020-12-10T18:25:59Z"],["dc.date.issued","2019"],["dc.description.abstract","The focusing and coherence properties of the NanoMAX Kirkpatrick–Baez mirror system at the fourth-generation MAX IV synchrotron in Lund have been characterized. The direct measurement of nano-focused X-ray beams is possible by scanning of an X-ray waveguide, serving basically as an ultra-thin slit. In quasi-coherent operation, beam sizes of down to 56 nm (FWHM, horizontal direction) can be achieved. Comparing measured Airy-like fringe patterns with simulations, the degree of coherence"],["dc.identifier.doi","10.1107/S1600577519003886"],["dc.identifier.issn","1600-5775"],["dc.identifier.purl","https://resolver.sub.uni-goettingen.de/purl?gs-1/16741"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/75900"],["dc.language.iso","en"],["dc.notes.intern","DOI Import GROB-354"],["dc.relation.issn","1600-5775"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.rights","CC BY 4.0"],["dc.rights.uri","https://goedoc.uni-goettingen.de/licenses"],["dc.subject.gro","x-ray optics"],["dc.title","Focus characterization of the NanoMAX Kirkpatrick–Baez mirror system"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.subtype","original_ja"],["dc.type.version","published_version"],["dspace.entity.type","Publication"]]