Soltau, Jakob

[["dc.bibliographiccitation.issue","22"],["dc.bibliographiccitation.journal","Physical Review Letters"],["dc.bibliographiccitation.volume","128"],["dc.contributor.author","Soltau, Jakob"],["dc.contributor.author","Osterhoff, Markus"],["dc.contributor.author","Salditt, Tim"],["dc.date.accessioned","2022-06-07T06:45:02Z"],["dc.date.available","2022-06-07T06:45:02Z"],["dc.date.issued","2022"],["dc.description.abstract","We present a novel approach to x-ray microscopy based on a multilayer zone plate which is positioned\r\nbehind a sample similar to an objective lens. However, unlike transmission x-ray microscopy, we do not\r\ncontent ourselves with a sharp intensity image; instead, we incorporate the multilayer zone plate transfer\r\nfunction directly in an iterative phase retrieval scheme to exploit the large diffraction angles of the small\r\nlayers. The presence of multiple diffraction orders, which is conventionally a nuisance, now comes as an\r\nadvantage for the reconstruction and photon efficiency. In a first experiment, we achieve sub-10-nm\r\nresolution and a quantitative phase contrast."],["dc.identifier.doi","10.1103/PhysRevLett.128.223901"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/108716"],["dc.language.iso","en"],["dc.relation","SFB 1456 | Cluster C | C03: Intensity correlations in diffraction experiments: convolution, reconstruction and information"],["dc.relation","SFB 1456: Mathematik des Experiments: Die Herausforderung indirekter Messungen in den Naturwissenschaften"],["dc.relation.issn","0031-9007"],["dc.relation.issn","1079-7114"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.rights","CC BY 4.0"],["dc.subject.gro","x-ray optics"],["dc.subject.gro","x-ray imaging"],["dc.title","Coherent Diffractive Imaging with Diffractive Optics"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.subtype","original_ja"],["dc.type.version","published_version"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","1173"],["dc.bibliographiccitation.issue","4"],["dc.bibliographiccitation.journal","Journal of Synchrotron Radiation"],["dc.bibliographiccitation.lastpage","1180"],["dc.bibliographiccitation.volume","26"],["dc.contributor.author","Osterhoff, Markus"],["dc.contributor.author","Robisch, Anna-Lena"],["dc.contributor.author","Soltau, Jakob"],["dc.contributor.author","Eckermann, Marina"],["dc.contributor.author","Kalbfleisch, Sebastian"],["dc.contributor.author","Carbone, Dina"],["dc.contributor.author","Johansson, Ulf"],["dc.contributor.author","Salditt, Tim"],["dc.date.accessioned","2020-12-10T18:25:59Z"],["dc.date.available","2020-12-10T18:25:59Z"],["dc.date.issued","2019"],["dc.description.abstract","The focusing and coherence properties of the NanoMAX Kirkpatrick–Baez mirror system at the fourth-generation MAX IV synchrotron in Lund have been characterized. The direct measurement of nano-focused X-ray beams is possible by scanning of an X-ray waveguide, serving basically as an ultra-thin slit. In quasi-coherent operation, beam sizes of down to 56 nm (FWHM, horizontal direction) can be achieved. Comparing measured Airy-like fringe patterns with simulations, the degree of coherence"],["dc.identifier.doi","10.1107/S1600577519003886"],["dc.identifier.issn","1600-5775"],["dc.identifier.purl","https://resolver.sub.uni-goettingen.de/purl?gs-1/16741"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/75900"],["dc.language.iso","en"],["dc.notes.intern","DOI Import GROB-354"],["dc.relation.issn","1600-5775"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.rights","CC BY 4.0"],["dc.rights.uri","https://goedoc.uni-goettingen.de/licenses"],["dc.subject.gro","x-ray optics"],["dc.title","Focus characterization of the NanoMAX Kirkpatrick–Baez mirror system"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.subtype","original_ja"],["dc.type.version","published_version"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.artnumber","012049"],["dc.bibliographiccitation.issue","1"],["dc.bibliographiccitation.journal","Journal of Physics. Conference Series"],["dc.bibliographiccitation.volume","849"],["dc.contributor.affiliation","Osterhoff, Markus;"],["dc.contributor.affiliation","Eberl, Christian;"],["dc.contributor.affiliation","Soltau, Jakob;"],["dc.contributor.affiliation","Krebs, Hans-Ulrich;"],["dc.contributor.author","Osterhoff, Markus"],["dc.contributor.author","Eberl, Christian"],["dc.contributor.author","Soltau, Jakob"],["dc.contributor.author","Krebs, Hans-Ulrich"],["dc.date.accessioned","2020-01-31T12:29:55Z"],["dc.date.available","2020-01-31T12:29:55Z"],["dc.date.issued","2017"],["dc.date.updated","2022-03-11T06:44:43Z"],["dc.description.abstract","With Pulsed Laser Deposition, Multilayer Zone Plates can be fabricated to focus hard x-ray beams into 2D spots smaller than 10 nm. To put these optics into use for imaging applications, we have commissioned a new dedicated sample tower as a high-resolution module for the GINIX instrument, stationed at the P10 beamline at PETRA III. Here we summarise the motorisation and show first imaging benchmark results obtained with a \"traditional\" Fresnel Zone Plate. The first 2D continuous STXM scan using the new EigerX 4M detector at full 750 Hz speed is shown: a field of view of roughly about 1 μm squared has been recorded with 255 × 255 images within 96 seconds."],["dc.identifier.doi","10.1088/1742-6596/849/1/012049"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/62920"],["dc.language.iso","en"],["dc.relation","SFB 755: Nanoscale Photonic Imaging"],["dc.relation.eissn","1742-6596"],["dc.relation.issn","1742-6588"],["dc.relation.issn","1742-6596"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.rights.uri","http://creativecommons.org/licenses/by/3.0/"],["dc.subject.gro","x-ray optics"],["dc.subject.gro","x-ray imaging"],["dc.title","Preparing for hard x-ray microscopy with Multilayer Zone Plates"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]