Hoffmann, Jörg

[["dc.bibliographiccitation.firstpage","2487"],["dc.bibliographiccitation.journal","PHYSICA C"],["dc.bibliographiccitation.lastpage","2488"],["dc.bibliographiccitation.volume","341"],["dc.contributor.author","Vostner, A."],["dc.contributor.author","Weber, H. W."],["dc.contributor.author","Mathen, A."],["dc.contributor.author","Jooss, C."],["dc.contributor.author","Hoffmann, J."],["dc.contributor.author","Freyhardt, Herbert C."],["dc.date.accessioned","2018-11-07T08:47:03Z"],["dc.date.available","2018-11-07T08:47:03Z"],["dc.date.issued","2000"],["dc.description.abstract","Results on the field and temperature dependence of the: critical transport current density in YBa2Cu3O7-delta coated conductors of various thickness are presented. The conductors were deposited by liquid phase epitaxy on RE-123 buffer layers on MgO substrates. The analysis of the remanent fields in magnetization loops with different maximum external field provides information about the inter- and intragrain current distribution. From the reverse leg of the magnetization loops the average grain size in the YBCO layer can be estimated. The results of these magnetic measurements are compared to those obtained from magneto-optical imaging. Modifications of the defect structure by neutron irradiation are reported as well. The resulting defects are either collision cascades, originating from fast neutrons (E > 0.1 MeV), or point defects, originating from neutrons with lower energies. Their influence on J(c) will be discussed."],["dc.identifier.doi","10.1016/S0921-4534(00)01277-6"],["dc.identifier.isi","000165856000169"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/20851"],["dc.notes.status","zu prüfen"],["dc.notes.submitter","Najko"],["dc.publisher","Elsevier Science Bv"],["dc.publisher.place","Amsterdam"],["dc.relation.conference","International Conference on Materials and Mechanisms of Superconductivity High Temperature Superconductors VI"],["dc.relation.eventlocation","HOUSTON, TEXAS"],["dc.relation.issn","0921-4534"],["dc.title","Characterization of YBCO coated conductors deposited by LPE on MgO substrates"],["dc.type","conference_paper"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.status","published"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.artnumber","243502"],["dc.bibliographiccitation.issue","24"],["dc.bibliographiccitation.journal","Applied Physics Letters"],["dc.bibliographiccitation.volume","110"],["dc.contributor.author","Kramer, Thilo"],["dc.contributor.author","Scherff, Malte"],["dc.contributor.author","Mierwaldt, Daniel"],["dc.contributor.author","Hoffmann, Joerg"],["dc.contributor.author","Jooss, Christian"],["dc.date.accessioned","2018-11-07T10:22:44Z"],["dc.date.available","2018-11-07T10:22:44Z"],["dc.date.issued","2017"],["dc.description.abstract","Non-volatile resistance change under electric stimulation in oxides is a promising path to next generation memory devices. However, the underlying mechanisms are still not fully understood. We report here on the study of switching in Pr0.67Ca0.33MnO3-delta (PCMO) films sandwiched by noble metal Pt electrodes, where electrode oxidation can be excluded. In order to develop an understanding of the switching induced oxygen migration, its initial concentration is modified by post-annealing of the deposited PCMO films. The oxygen distribution is obtained by manganese valence determination using spatially resolved electron energy loss spectroscopy in scanning transmission electron microscopy mode. We observe correlations between virgin state resistance, resistive switching properties, oxygen vacancy distribution, and stress/strain state of the PCMO films and propose a simplified interface resistance model based on the measured valence distribution. It assumes a linear correlation of oxygen vacancy concentration with conductivity and a metal to insulator transition above a critical vacancy concentration threshold. Our results suggest that resistance changes can take place at both interfaces of symmetric devices and only requires small changes in oxygen vacancy concentration. (C) 2017 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/)."],["dc.description.sponsorship","DFG [Jo 348/10-01]"],["dc.identifier.doi","10.1063/1.4985645"],["dc.identifier.isi","000403678300029"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/42329"],["dc.notes.status","zu prüfen"],["dc.notes.submitter","PUB_WoS_Import"],["dc.relation.issn","1077-3118"],["dc.relation.issn","0003-6951"],["dc.relation.orgunit","Institut für Materialphysik"],["dc.title","Role of oxygen vacancies for resistive switching in noble metal sandwiched Pr0.67Ca0.33MnO3-delta"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.artnumber","PII S0921-4534(02)00892-4"],["dc.bibliographiccitation.firstpage","723"],["dc.bibliographiccitation.journal","Physica C Superconductivity"],["dc.bibliographiccitation.lastpage","728"],["dc.bibliographiccitation.volume","372"],["dc.contributor.author","Dzick, J."],["dc.contributor.author","Hoffmann, J."],["dc.contributor.author","Sievers, S."],["dc.contributor.author","Kautschor, L. O."],["dc.contributor.author","Freyhardt, Herbert C."],["dc.date.accessioned","2018-11-07T10:17:41Z"],["dc.date.available","2018-11-07T10:17:41Z"],["dc.date.issued","2002"],["dc.description.abstract","For high-current carrying YBa2Cu3O7-x films, biaxially textured yttria-stabilized zirconia (YSZ) films serve as templates. The YSZ layers are textured by an ion-beam-assisted deposition process (IBAD). Our present investigations of the texture evolution indicated a sequence of at least three characteristic growth stages. During an initial stage, wire-textured (011)-oriented grains nucleated. This stage was followed by a transition stage where (DOI)-oriented grains grew epitaxially on (011) grains which were favorably oriented with respect to the assisting beam. During the final stage a growth selection led to an improvement of the in-plane alignment of those (001)-oriented grains with their (111) axis parallel to the assisting beam. Each one of these growth stages was dominated by specific underlying mechanisms which have been identified. Internal film stresses caused by the massive bombardment of the assisting beam might influence the orientation of nuclei. Ion-beam-induced homoepitaxy generated epitaxial relations between nuclei and underlying film layers. Finally, anisotropic sputter rates caused alterations in growth rates of differently oriented grains that led to an overgrowth of misoriented grains. These results will be summarized in the form of a schematic growth model for IBAD-YSZ films. (C) 2002 Elsevier Science B.V. All rights reserved."],["dc.identifier.doi","10.1016/S0921-4534(02)00892-4"],["dc.identifier.isi","000178018800036"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/41278"],["dc.notes.status","zu prüfen"],["dc.notes.submitter","Najko"],["dc.publisher","Elsevier Science Bv"],["dc.publisher.place","Amsterdam"],["dc.relation.conference","5th European Conference on Applied Superconductivity (EUCAS 2001)"],["dc.relation.eventlocation","TECH UNIV DENMARK, LYNGBY, DENMARK"],["dc.relation.issn","0921-4534"],["dc.title","Ion-beam-assisted texturing of YSZ layers"],["dc.type","conference_paper"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.status","published"],["dspace.entity.type","Publication"]]

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Padilha, Antonio Claudio"],["dc.contributor.author","Martini Dalpian, Gustavo"],["dc.contributor.author","Reily Rocha, Alexandre"],["dc.contributor.author","Prodromakis, Themistoklis"],["dc.contributor.author","Salaoru, Iulia"],["dc.contributor.author","Khiat, Ali"],["dc.contributor.author","Toumazou, Christopher"],["dc.contributor.author","Gale, Ella M."],["dc.contributor.author","Madhavan, A."],["dc.contributor.author","Adam, G."],["dc.contributor.author","Alibart, F."],["dc.contributor.author","Gao, L."],["dc.contributor.author","Strukov, D. B."],["dc.contributor.author","Wamwangi, D."],["dc.contributor.author","Welnic, W."],["dc.contributor.author","Wuttig, M."],["dc.contributor.author","Gholipour, Behrad"],["dc.contributor.author","Huang, Chung-Che"],["dc.contributor.author","Anastasopoulos, Alexandros"],["dc.contributor.author","Al-Saab, Feras"],["dc.contributor.author","Hayden, Brian E."],["dc.contributor.author","Hewak, Daniel W."],["dc.contributor.author","Lan, Rui"],["dc.contributor.author","Endo, Rie"],["dc.contributor.author","Kuwahara, Masashi"],["dc.contributor.author","Kobayashi, Yoshinao"],["dc.contributor.author","Susa, Masahiro"],["dc.contributor.author","Baumeister, Paul"],["dc.contributor.author","Wortmann, Daniel"],["dc.contributor.author","Blügel, Stefan"],["dc.contributor.author","Mazzarello, Riccardo"],["dc.contributor.author","Li, Yan"],["dc.contributor.author","Zhang, Wei"],["dc.contributor.author","Ronneberger, Ider"],["dc.contributor.author","Simon, Ronnie"],["dc.contributor.author","Gallus, Jens"],["dc.contributor.author","Bessas, Dimitrios"],["dc.contributor.author","Sergueev, Ilya"],["dc.contributor.author","Wille, Hans-Christian"],["dc.contributor.author","Pierre Hermann, Raphaël"],["dc.contributor.author","Luckas, Jennifer"],["dc.contributor.author","Rausch, Pascal"],["dc.contributor.author","Krebs, Daniel"],["dc.contributor.author","Zalden, Peter"],["dc.contributor.author","Boltz, Janika"],["dc.contributor.author","Raty, Jean-Yves"],["dc.contributor.author","Salinga, Martin"],["dc.contributor.author","Longeaud, Christophe"],["dc.contributor.author","Wuttig, Matthias"],["dc.contributor.author","Kim, Haeri"],["dc.contributor.author","Kim, Dong-Wook"],["dc.contributor.author","Phark, Soo-Hyon"],["dc.contributor.author","Hong, Seungbum"],["dc.contributor.author","Park, C."],["dc.contributor.author","Herpers, A."],["dc.contributor.author","Bruchhaus, R."],["dc.contributor.author","Verbeeck, J."],["dc.contributor.author","Egoavil, R."],["dc.contributor.author","Borgatti, F."],["dc.contributor.author","Panaccione, G."],["dc.contributor.author","Offi, F."],["dc.contributor.author","Dittmann, R."],["dc.contributor.author","Clima, Sergiu"],["dc.contributor.author","Sankaran, Kiroubanand"],["dc.contributor.author","Mees, Maarten"],["dc.contributor.author","Yin Chen, Yang"],["dc.contributor.author","Goux, Ludovic"],["dc.contributor.author","Govoreanu, Bogdan"],["dc.contributor.author","Wouters, Dirk J."],["dc.contributor.author","Kittl, Jorge"],["dc.contributor.author","Jurczak, Malgorzata"],["dc.contributor.author","Pourtois, Geoffrey"],["dc.contributor.author","Calka, P."],["dc.contributor.author","Martinez, E."],["dc.contributor.author","Delaye, V."],["dc.contributor.author","Lafond, D."],["dc.contributor.author","Audoit, G."],["dc.contributor.author","Mariolle, D."],["dc.contributor.author","Chevalier, N."],["dc.contributor.author","Grampeix, H."],["dc.contributor.author","Cagli, C."],["dc.contributor.author","Jousseaume, V."],["dc.contributor.author","Guedj, C."],["dc.contributor.author","Shrestha, Pragya"],["dc.contributor.author","Ochia, Adaku"],["dc.contributor.author","Cheung, Kin. P."],["dc.contributor.author","Campbell, Jason"],["dc.contributor.author","Baumgart, Helmut"],["dc.contributor.author","Harris, Gary"],["dc.contributor.author","Scherff, Malte"],["dc.contributor.author","Meyer, Bjoern"],["dc.contributor.author","Scholz, Julius"],["dc.contributor.author","Hoffmann, Joerg"],["dc.contributor.author","Jooss, Christian"],["dc.contributor.author","Xiao, Bo"],["dc.contributor.author","Tada, Tomofumi"],["dc.contributor.author","Gu, Tingkun"],["dc.contributor.author","Tawara, Arihiro"],["dc.contributor.author","Watanabe, Satoshi"],["dc.contributor.author","Young, Tai-Fa"],["dc.contributor.author","Yang, Ya-Liang"],["dc.contributor.author","Chang, Ting-Chang"],["dc.contributor.author","Hsu, Kuang-Ting"],["dc.contributor.author","Chen, Chao-Yu"],["dc.contributor.author","Burkert, A"],["dc.contributor.author","Valov, I."],["dc.contributor.author","Staikov, G."],["dc.contributor.author","Waser, R."],["dc.contributor.author","van den Hurk, Jan"],["dc.contributor.author","Valov, Ilia"],["dc.contributor.author","Waser, Rainer"],["dc.contributor.author","Valov, Ilia"],["dc.contributor.author","Tappertzhofen, Stefan"],["dc.contributor.author","van der Hurk, Jan"],["dc.contributor.author","Waser, Rainer"],["dc.contributor.author","Adam, G."],["dc.contributor.author","Alibart, F."],["dc.contributor.author","Gao, L."],["dc.contributor.author","Hoskins, B."],["dc.contributor.author","Strukov, D. B."],["dc.contributor.author","Jean Yoon, Kyung"],["dc.contributor.author","Ji Song, Seul"],["dc.contributor.author","Kim, Gun Hwan"],["dc.contributor.author","Seok, Jun Yeong"],["dc.contributor.author","Ho Yoon, Jeong"],["dc.contributor.author","Seong Hwang, Cheol"],["dc.contributor.author","Yoon, Jung Ho"],["dc.contributor.author","Yoon, Kyung Jin"],["dc.contributor.author","Shuai, Yao"],["dc.contributor.author","Wu, Chuangui"],["dc.contributor.author","Zhang, Wanli"],["dc.contributor.author","Zhou, Shengqiang"],["dc.contributor.author","Bürger, Danilo"],["dc.contributor.author","Slesazeck, Stefan"],["dc.contributor.author","Mikolajick, Thomas"],["dc.contributor.author","Helm, Manfred"],["dc.contributor.author","Schmidt, Heidemarie"],["dc.contributor.author","Gale, Ella"],["dc.contributor.author","Pearson, David"],["dc.contributor.author","Kitson, Stephen"],["dc.contributor.author","Adamatzky, Andrew"],["dc.contributor.author","Costello, Ben de Lacy"],["dc.contributor.author","Lehtonen, Eero"],["dc.contributor.author","Poikonen, Jussi"],["dc.contributor.author","Laiho, Mika"],["dc.contributor.author","Kanerva, Pentti"],["dc.contributor.author","Lim, Hyungkwang"],["dc.contributor.author","Jang, Ho-won"],["dc.contributor.author","Jeong, Doo Seok"],["dc.contributor.author","Cao, Xun"],["dc.contributor.author","Jiang, Meng"],["dc.contributor.author","Zhang, Feng"],["dc.contributor.author","Liu, Xinjun"],["dc.contributor.author","Jin, Ping"],["dc.contributor.author","Zhang, Kai"],["dc.contributor.author","Tangirala, Madhavi"],["dc.contributor.author","Shrestha, Pragya"],["dc.contributor.author","Baumgart, Helmut"],["dc.contributor.author","Kittiwatanakul, Salinporn"],["dc.contributor.author","Lu, Jiwei"],["dc.contributor.author","Wolf, Stuart"],["dc.contributor.author","Pallem, Venkateswara"],["dc.contributor.author","Dussarrat, Christian"],["dc.contributor.author","Pinto, S."],["dc.contributor.author","Krishna, R."],["dc.contributor.author","Dias, C."],["dc.contributor.author","Pimentel, G."],["dc.contributor.author","Oliveira, G. N. P."],["dc.contributor.author","Teixeira, J. M."],["dc.contributor.author","Aguiar, P."],["dc.contributor.author","Titus, E."],["dc.contributor.author","Gracio, J."],["dc.contributor.author","Ventura, J."],["dc.contributor.author","Araujo, J. P."],["dc.contributor.editor","Heber, Jörg"],["dc.contributor.editor","Schlom, Darrell"],["dc.contributor.editor","Tokura, Yoshinori"],["dc.contributor.editor","Waser, Rainer"],["dc.contributor.editor","Wuttig, Matthias"],["dc.date.accessioned","2021-12-08T12:29:05Z"],["dc.date.available","2021-12-08T12:29:05Z"],["dc.date.issued","2013"],["dc.identifier.doi","10.1002/9783527667703.ch67"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/95954"],["dc.language.iso","en"],["dc.notes.intern","DOI-Import GROB-476"],["dc.publisher","Wiley-VCH Verlag GmbH & Co. KGaA"],["dc.publisher.place","Weinheim, Germany"],["dc.relation.eisbn","9783527667703"],["dc.relation.isbn","9783527411917"],["dc.relation.ispartof","Frontiers in Electronic Materials : \n A Collection of Extended Abstracts of the Nature Conference Frontiers in Electronic Materials, June 17\n th\n to 20\n th\n 2012, Aachen, Germany"],["dc.title","Poster: Memristive Systems"],["dc.type","book_chapter"],["dc.type.internalPublication","yes"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","1462"],["dc.bibliographiccitation.issue","11"],["dc.bibliographiccitation.journal","Journal of Materials Research"],["dc.bibliographiccitation.lastpage","1470"],["dc.bibliographiccitation.volume","27"],["dc.contributor.author","Hoffmann, Joerg"],["dc.contributor.author","Schnittger, Sven"],["dc.contributor.author","Norpoth, Jonas"],["dc.contributor.author","Raabe, Stephanie"],["dc.contributor.author","Kramer, Thilo"],["dc.contributor.author","Jooss, Christian"],["dc.date.accessioned","2018-11-07T09:10:03Z"],["dc.date.available","2018-11-07T09:10:03Z"],["dc.date.issued","2012"],["dc.description.abstract","Fabrication of thin film nanocomposites via decomposition and self-assembly from the vapor phase is a promising path for cost-effective fabrication of multifunctional materials. In particular, oxides as a new class of energy materials allow for rich functionalities, e. g., by combining p-and n-doped systems in catalytic or light harvesting units. Combining A-site doped perovskites ABO(3) with CoFe2O4 spinel, we have investigated thin film phase composition and nanocomposite morphology in the pseudobinary system La0.6Sr0.4BO3-CoFe2O4 for B = Fe, Co, and Mn. We observe formation of an epitaxial two-phase nanocomposite for B = Fe, i.e., the coexistence of La0.6Sr0.4FeO3 and CoFe2O4. In contrast, for B = Co or Mn nanocomposites are formed, where perovskite La0.6Sr0.4BO3 solid solutions coexists with Co-rich spinel and periclase phases. We derive conclusions for the preparation of perovskite-spinel nanocomposites with well-designed doping levels."],["dc.description.sponsorship","Deutsche Forschungsgemeinschaft [JO 348/8, SFB 602]"],["dc.identifier.doi","10.1557/jmr.2012.84"],["dc.identifier.isi","000304067600006"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/26404"],["dc.notes.status","zu prüfen"],["dc.notes.submitter","Najko"],["dc.publisher","Cambridge Univ Press"],["dc.relation.issn","0884-2914"],["dc.title","Nanocomposite stability in Fe-, Co-, and Mn-based perovskite/spinel systems"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.status","published"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","3378"],["dc.bibliographiccitation.issue","16"],["dc.bibliographiccitation.journal","Advanced Functional Materials"],["dc.bibliographiccitation.lastpage","3388"],["dc.bibliographiccitation.volume","22"],["dc.contributor.author","Raabe, Stephanie"],["dc.contributor.author","Mierwaldt, Daniel"],["dc.contributor.author","Ciston, Jim"],["dc.contributor.author","Uijttewaal, Matthe"],["dc.contributor.author","Stein, Helge"],["dc.contributor.author","Hoffmann, Joerg"],["dc.contributor.author","Zhu, Y."],["dc.contributor.author","Bloechl, Peter E."],["dc.contributor.author","Jooss, Christian"],["dc.date.accessioned","2018-11-07T09:07:08Z"],["dc.date.available","2018-11-07T09:07:08Z"],["dc.date.issued","2012"],["dc.description.abstract","Fundamental studies of catalysts based on manganese oxide compounds are of high interest since they offer the opportunity to study the role of variable valence state in the active state during O2 evolution from H2O. This paper presents a study of doping dependent O2 evolution electrocatalysis of Pr-doped CaMnO3 via in situ environmental transmission electron microscopy (ETEM) combined with ex situ cyclic voltammetry studies. ETEM studies of heterogeneous catalysis are a challenge, since the reactions in the H2O vapor phase cannot directly be observed. It is shown that the oxidation of silane by free oxygen to solid SiO2-x can be used to monitor catalytic oxygen evolution. Electron energy loss spectroscopy (EELS) as well as the in situ X-ray absorption study of near edge structures (XANES) in H2O vapor reveals that the Mn valence is decreased in the active state. Careful TEM analysis of samples measured by ex situ cyclic voltammetry and an in situ bias-controlled ETEM study allows us to distinguish between self-formation during oxygen evolution and corrosion at the Pr1-xCaxMnO3-H2O interface. Including density functional theory (DFT) calculations, trends in O2 evolution activity and defect chemistry in the active state can be correclated to doping induced changes of the electronic band structure in A-site doped manganites."],["dc.identifier.doi","10.1002/adfm.201103173"],["dc.identifier.isi","000307566200003"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/25721"],["dc.notes.status","zu prüfen"],["dc.notes.submitter","Najko"],["dc.relation.issn","1616-3028"],["dc.relation.issn","1616-301X"],["dc.relation.orgunit","Institut für Materialphysik"],["dc.title","In Situ Electrochemical Electron Microscopy Study of Oxygen Evolution Activity of Doped Manganite Perovskites"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.artnumber","132409"],["dc.bibliographiccitation.issue","13"],["dc.bibliographiccitation.journal","Physical Review. B"],["dc.bibliographiccitation.volume","77"],["dc.contributor.author","Jooss, Ch."],["dc.contributor.author","Hoffmann, J."],["dc.contributor.author","Fladerer, J."],["dc.contributor.author","Ehrhardt, M."],["dc.contributor.author","Beetz, T."],["dc.contributor.author","Wu, L."],["dc.contributor.author","Zhu, Y."],["dc.date.accessioned","2018-11-07T11:16:50Z"],["dc.date.available","2018-11-07T11:16:50Z"],["dc.date.issued","2008"],["dc.description.abstract","Combining pulse-probe measurements as well as local transport measurements in an electron microscope system by a simultaneous monitoring of the structural changes, we show that the nonvolatile electric pulse induced resistance change in Ca-doped praseodymium manganite is related to a polaron order-disorder transition, modified by electronic band bending in the vicinity of an interface to a metallic electrode. A pronounced resistance change requires a critical distance between the two electrode and/or oxide interfaces to form an insulating incommensurate polaron-ordered phase during the initialization of the device. Based on these observations, a qualitative model for the electronic structure of the metal-oxide interface is developed."],["dc.identifier.doi","10.1103/PhysRevB.77.132409"],["dc.identifier.isi","000255457200017"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/54686"],["dc.notes.status","zu prüfen"],["dc.notes.submitter","Najko"],["dc.relation.issn","1098-0121"],["dc.relation.orgunit","Institut für Materialphysik"],["dc.title","Electric pulse induced resistance change effect in manganites due to polaron localization at the metal-oxide interfacial region"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","731"],["dc.bibliographiccitation.issue","4"],["dc.bibliographiccitation.journal","Journal of Materials Science"],["dc.bibliographiccitation.lastpage","736"],["dc.bibliographiccitation.volume","37"],["dc.contributor.author","Borchers, Christine"],["dc.contributor.author","Troche, P."],["dc.contributor.author","Herweg, C."],["dc.contributor.author","Hoffmann, J."],["dc.date.accessioned","2018-11-07T10:31:56Z"],["dc.date.available","2018-11-07T10:31:56Z"],["dc.date.issued","2002"],["dc.description.abstract","Magnetron sputtered iron/gold multilayers are investigated by cross-sectional transmission electron microscopy. Thermodynamic considerations can explain the different observed microstructures near the substrate and near the top of the multilayers. (C) 2002 Kluwer Academic Publishers."],["dc.identifier.doi","10.1023/A:1013883629605"],["dc.identifier.isi","000173346500009"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/44227"],["dc.notes.status","zu prüfen"],["dc.notes.submitter","Najko"],["dc.relation.issn","0022-2461"],["dc.relation.orgunit","Institut für Materialphysik"],["dc.title","Interfacial energy induced microstructure of thin magnetic iron/gold multilayer films"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.firstpage","2170042"],["dc.bibliographiccitation.issue","9"],["dc.bibliographiccitation.journal","Small Methods"],["dc.bibliographiccitation.volume","5"],["dc.contributor.author","Meyer, Tobias"],["dc.contributor.author","Kressdorf, Birte"],["dc.contributor.author","Roddatis, Vladimir"],["dc.contributor.author","Hoffmann, Jörg"],["dc.contributor.author","Jooss, Christian"],["dc.contributor.author","Seibt, Michael"],["dc.date.accessioned","2021-12-08T12:27:17Z"],["dc.date.available","2021-12-08T12:27:17Z"],["dc.date.issued","2021"],["dc.identifier.doi","10.1002/smtd.202170042"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/95308"],["dc.language.iso","en"],["dc.notes.intern","DOI-Import GROB-476"],["dc.relation.eissn","2366-9608"],["dc.relation.issn","2366-9608"],["dc.title","Phase Transitions in a Perovskite Thin Film Studied by Environmental In Situ Heating Nano‐Beam Electron Diffraction (Small Methods 9/2021)"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dspace.entity.type","Publication"]]

[["dc.bibliographiccitation.artnumber","043718"],["dc.bibliographiccitation.issue","4"],["dc.bibliographiccitation.journal","Journal of Applied Physics"],["dc.bibliographiccitation.volume","110"],["dc.contributor.author","Scherff, Malte"],["dc.contributor.author","Meyer, B. U."],["dc.contributor.author","Hoffmann, J."],["dc.contributor.author","Jooss, C. H."],["dc.date.accessioned","2018-11-07T08:53:12Z"],["dc.date.available","2018-11-07T08:53:12Z"],["dc.date.issued","2011"],["dc.description.abstract","The electrically induced persistent resistance change in perovskite Pr0.7Ca0.3MnO3 films sandwiched by metallic electrodes is analyzed with respect to noble electrode materials (Pt, Au, and Ag) and geometric arrangement by electrical transport measurements. Comparing switching behavior in symmetric and asymmetric electrode interfaces gives evidence for identifying the active, single interface in the switching process. The interaction of two opposing interfaces can lead to an observed switching polarity inversion in different current density regimes in the otherwise well defined bipolar behavior. The different noble metals exhibit a quite similar switching behavior, but a lower interfacial resistance seems to favor switching. (C) 2011 American Institute of Physics. [doi:10.1063/1.3610429]"],["dc.identifier.doi","10.1063/1.3610429"],["dc.identifier.isi","000294484300078"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/22352"],["dc.notes.status","zu prüfen"],["dc.notes.submitter","Najko"],["dc.relation.issn","0021-8979"],["dc.relation.orgunit","Institut für Materialphysik"],["dc.title","Polarity reversal in bipolar resistive switching in Pr0.7Ca0.3MnO3 noble metal sandwich structures"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]