Laser-diode-stimulated emission depletion microscopy

ISSN
0003-6951
Date Issued
2003
Author(s)
Blanca, C. M.
DOI
10.1063/1.1571656
Abstract
We report subdiffraction resolution in far-field fluorescence microscopy through laser-diode-stimulated emission depletion of molecular markers. The diode-generated focal intensities lead to a resolution improvement by similar to45% in both lateral directions. Excitation and stimulated emission are performed with electronically synchronized diode pulses of 50-70 ps and 300-400 ps duration, respectively. The subdiffraction resolution is utilized to resolve neighboring individual molecules.