Now showing 1 - 5 of 5
  • 2014-07-28Journal Article Research Paper
    [["dc.bibliographiccitation.firstpage","18440"],["dc.bibliographiccitation.issue","15"],["dc.bibliographiccitation.journal","Optics express"],["dc.bibliographiccitation.lastpage","53"],["dc.bibliographiccitation.volume","22"],["dc.contributor.author","Keskinbora, Kahraman"],["dc.contributor.author","Robisch, Anna Lena"],["dc.contributor.author","Mayer, Marcel"],["dc.contributor.author","Sanli, Umut T."],["dc.contributor.author","Grévent, Corinne"],["dc.contributor.author","Wolter, Christian"],["dc.contributor.author","Weigand, Markus"],["dc.contributor.author","Szeghalmi, Adriana V."],["dc.contributor.author","Knez, Mato"],["dc.contributor.author","Salditt, Tim"],["dc.contributor.author","Schütz, Gisela"],["dc.date.accessioned","2019-07-10T08:11:56Z"],["dc.date.available","2019-07-10T08:11:56Z"],["dc.date.issued","2014-07-28"],["dc.description.abstract","X-ray microscopy is a successful technique with applications in several key fields. Fresnel zone plates (FZPs) have been the optical elements driving its success, especially in the soft X-ray range. However, focusing of hard X-rays via FZPs remains a challenge. It is demonstrated here, that two multilayer type FZPs, delivered from the same multilayer deposit, focus both hard and soft X-rays with high fidelity. The results prove that these lenses can achieve at least 21 nm half-pitch resolution at 1.2 keV demonstrated by direct imaging, and sub-30 nm FWHM (full-pitch) resolution at 7.9 keV, deduced from autocorrelation analysis. Reported FZPs had more than 10% diffraction efficiency near 1.5 keV."],["dc.identifier.pmid","25089463"],["dc.identifier.purl","https://resolver.sub.uni-goettingen.de/purl?gs-1/12649"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/60824"],["dc.language.iso","en"],["dc.relation.issn","1094-4087"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray optics"],["dc.subject.gro","x-ray imaging"],["dc.title","Multilayer Fresnel zone plates for high energy radiation resolve 21 nm features at 1.2 keV."],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.subtype","original_ja"],["dc.type.version","published_version"],["dspace.entity.type","Publication"]]
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  • 2013Journal Article Research Paper
    [["dc.bibliographiccitation.firstpage","19311"],["dc.bibliographiccitation.issue","16"],["dc.bibliographiccitation.journal","Optics Express"],["dc.bibliographiccitation.lastpage","19323"],["dc.bibliographiccitation.volume","21"],["dc.contributor.author","Döring, Florian"],["dc.contributor.author","Robisch, Anna-Lena"],["dc.contributor.author","Eberl, Christian"],["dc.contributor.author","Osterhoff, Markus"],["dc.contributor.author","Ruhlandt, Aike"],["dc.contributor.author","Liese, Tobias"],["dc.contributor.author","Schlenkrich, Felix"],["dc.contributor.author","Hoffmann, S."],["dc.contributor.author","Bartels, Matthias"],["dc.contributor.author","Salditt, Tim"],["dc.contributor.author","Krebs, Hans-Ulrich"],["dc.date.accessioned","2020-11-05T15:05:23Z"],["dc.date.available","2020-11-05T15:05:23Z"],["dc.date.issued","2013"],["dc.description.abstract","Compound optics such as lens systems can overcome the limitations concerning resolution, efficiency, or aberrations which fabrication constraints would impose on any single optical element. In this work we demonstrate unprecedented sub-5 nm point focusing of hard x-rays, based on the combination of a high gain Kirkpatrick-Baez (KB) mirror system and a high resolution W/Si multilayer zone plate (MZP) for ultra-short focal length f. The pre-focusing allows limiting the MZP radius to below 2 mu m, compatible with the required 5 nm structure width and essentially unlimited aspect ratios, provided by enabling fabrication technology based on pulsed laser deposition (PLD) and focused ion beam (FIB). (c) 2013 Optical Society of America"],["dc.identifier.doi","10.1364/OE.21.019311"],["dc.identifier.gro","3142308"],["dc.identifier.isi","000323049900072"],["dc.identifier.pmid","23938848"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/68456"],["dc.language.iso","en"],["dc.notes.intern","DOI Import GROB-352.6"],["dc.notes.status","final"],["dc.notes.submitter","PUB_WoS_Import"],["dc.relation","SFB 755: Nanoscale Photonic Imaging"],["dc.relation.eissn","1094-4087"],["dc.relation.issn","1094-4087"],["dc.relation.orgunit","Institut für Materialphysik"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray optics"],["dc.title","Sub-5 nm hard x-ray point focusing by a combined Kirkpatrick-Baez mirror and multilayer zone plate"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","yes"],["dc.type.subtype","original_ja"],["dspace.entity.type","Publication"]]
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  • 2019Journal Article Research Paper
    [["dc.bibliographiccitation.firstpage","1173"],["dc.bibliographiccitation.issue","4"],["dc.bibliographiccitation.journal","Journal of Synchrotron Radiation"],["dc.bibliographiccitation.lastpage","1180"],["dc.bibliographiccitation.volume","26"],["dc.contributor.author","Osterhoff, Markus"],["dc.contributor.author","Robisch, Anna-Lena"],["dc.contributor.author","Soltau, Jakob"],["dc.contributor.author","Eckermann, Marina"],["dc.contributor.author","Kalbfleisch, Sebastian"],["dc.contributor.author","Carbone, Dina"],["dc.contributor.author","Johansson, Ulf"],["dc.contributor.author","Salditt, Tim"],["dc.date.accessioned","2020-12-10T18:25:59Z"],["dc.date.available","2020-12-10T18:25:59Z"],["dc.date.issued","2019"],["dc.description.abstract","The focusing and coherence properties of the NanoMAX Kirkpatrick–Baez mirror system at the fourth-generation MAX IV synchrotron in Lund have been characterized. The direct measurement of nano-focused X-ray beams is possible by scanning of an X-ray waveguide, serving basically as an ultra-thin slit. In quasi-coherent operation, beam sizes of down to 56 nm (FWHM, horizontal direction) can be achieved. Comparing measured Airy-like fringe patterns with simulations, the degree of coherence"],["dc.identifier.doi","10.1107/S1600577519003886"],["dc.identifier.issn","1600-5775"],["dc.identifier.purl","https://resolver.sub.uni-goettingen.de/purl?gs-1/16741"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/75900"],["dc.language.iso","en"],["dc.notes.intern","DOI Import GROB-354"],["dc.relation.issn","1600-5775"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.rights","CC BY 4.0"],["dc.rights.uri","https://goedoc.uni-goettingen.de/licenses"],["dc.subject.gro","x-ray optics"],["dc.title","Focus characterization of the NanoMAX Kirkpatrick–Baez mirror system"],["dc.type","journal_article"],["dc.type.internalPublication","yes"],["dc.type.subtype","original_ja"],["dc.type.version","published_version"],["dspace.entity.type","Publication"]]
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  • 2013Conference Paper
    [["dc.bibliographiccitation.artnumber","884802"],["dc.bibliographiccitation.volume","8848"],["dc.contributor.author","Osterhoff, Markus"],["dc.contributor.author","Bartels, Matthias"],["dc.contributor.author","Döring, Florian"],["dc.contributor.author","Eberl, Christian"],["dc.contributor.author","Hoinkes, Thomas"],["dc.contributor.author","Hoffmann-Urlaub, Sarah"],["dc.contributor.author","Liese, Tobias"],["dc.contributor.author","Radisch, Volker"],["dc.contributor.author","Rauschenbeutel, Arno"],["dc.contributor.author","Robisch, Anna Lena"],["dc.contributor.author","Ruhlandt, Aike"],["dc.contributor.author","Schlenkrich, Felix"],["dc.contributor.author","Salditt, Tim"],["dc.contributor.author","Krebs, Hans Ulrich"],["dc.contributor.editor","Goto, Shunji"],["dc.contributor.editor","Morawe, Christian"],["dc.contributor.editor","Khounsary, Ali"],["dc.date.accessioned","2020-02-24T13:39:51Z"],["dc.date.available","2020-02-24T13:39:51Z"],["dc.date.issued","2013"],["dc.description.abstract","We present experiments carried out using a combined hard x-ray focusing set-up preserving the benefits of a large-aperture Kirckpatrick-Baez (KB) mirror system and a small focal length multilayer zone plane (MZP). The high gain KB mirrors produce a pre-focus of 400 nm × 200 nm; in their defocus, two MZP lenses of diameter of 1.6 μm and 3.7 μm have been placed, with focal lengths of 50 μm and 250 μm respectively. The lenses have been produced using pulsed laser deposition (PLD) and focused ion beam (FIB). Forward simulations including error models based on measured deviations, auto-correlation analysis and three-plane phase reconstruction support two-dimensional focus sizes of 4.3 nm × 4.7 nm (7:9 keV, W/Si)1 and 4.3 nm ×5.9 nm (13:8 keV, W/ZrO2), respectively."],["dc.identifier.doi","10.1117/12.2025389"],["dc.identifier.gro","3145113"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/2814"],["dc.language.iso","en"],["dc.notes.intern","Crossref Import"],["dc.notes.status","final"],["dc.relation.conference","SPIE"],["dc.relation.crisseries","Proceedings of SPIE"],["dc.relation.eventend","2013-08-28"],["dc.relation.eventlocation","San Diego"],["dc.relation.eventstart","2013"],["dc.relation.isbn","978-0-8194-9698-0"],["dc.relation.ispartof","Advances in X-ray/EUV optics and components VIII"],["dc.relation.ispartofseries","Proceedings of SPIE; 8848"],["dc.relation.issn","0277-786X"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray optics"],["dc.title","Two-dimensional sub-5-nm hard x-ray focusing with MZP"],["dc.type","conference_paper"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","no"],["dspace.entity.type","Publication"]]
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  • 2013Conference Paper
    [["dc.contributor.author","Keskinbora, Kahraman"],["dc.contributor.author","Robisch, Anna-Lena"],["dc.contributor.author","Mayer, Marcel"],["dc.contributor.author","Grévent, Corinne"],["dc.contributor.author","Szeghalmi, Adriana V."],["dc.contributor.author","Knez, Mato"],["dc.contributor.author","Weigand, Markus"],["dc.contributor.author","Snigireva, Irina"],["dc.contributor.author","Snigirev, Anatoly"],["dc.contributor.author","Salditt, Tim"],["dc.contributor.author","Schütz, Gisela"],["dc.date.accessioned","2017-09-07T11:54:08Z"],["dc.date.available","2017-09-07T11:54:08Z"],["dc.date.issued","2013"],["dc.identifier.doi","10.1117/12.2027251"],["dc.identifier.gro","3145114"],["dc.identifier.uri","https://resolver.sub.uni-goettingen.de/purl?gro-2/2815"],["dc.language.iso","en"],["dc.notes.intern","Crossref Import"],["dc.notes.status","public"],["dc.publisher","SPIE"],["dc.publisher.place","Bellingham, Wash."],["dc.relation.conference","SPIE X-Ray Nanoimaging Conference"],["dc.relation.eventend","2013-08-29"],["dc.relation.eventlocation","San Diego, Calif."],["dc.relation.eventstart","2013-08-28"],["dc.relation.isbn","978-0-8194-9701-7"],["dc.relation.ispartof","X-ray nanoimaging: instruments and methods; 28 - 29 August 2013, San Diego, California, United States"],["dc.relation.orgunit","Institut für Röntgenphysik"],["dc.relation.workinggroup","RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)"],["dc.subject.gro","x-ray optics"],["dc.title","Recent advances in use of atomic layer deposition and focused ion beams for fabrication of Fresnel zone plates for hard x-rays"],["dc.type","conference_paper"],["dc.type.internalPublication","yes"],["dc.type.peerReviewed","no"],["dspace.entity.type","Publication"]]
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